Single axis mode semiconductor laser characteristic measuring apparatus
文献类型：专利
| 作者 | UEHARA KUNIO |
| 发表日期 | 1991-02-04 |
| 专利号 | JP1991025989A |
| 著作权人 | NEC CORP |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Single axis mode semiconductor laser characteristic measuring apparatus |
| 英文摘要 | PURPOSE:To accurately sort single axis mode characteristic at the stage of a chip by providing an input light observing unit having a band pass filter function independently controllable with a band central wavelength and a transmitting band width, and a temperature control mechanism of a semiconductor laser to be measured. CONSTITUTION:A current If is supplied from a power source 2 to an element 1 to be measured, and the temperature Ta of the element 1 to be measured is controlled by a temperature regulator 3. The band central wavelength lambdac and the transmission band width W of a band pass filter 5 can be independently set. When the element is a DFB LD having 3mum band and the required operating range is about 25+ or -5 deg.C, if the junction current If of a predetermined light output L=10mW at Ta=25 deg.C is 50mA, the band central wavelength lambdac of the band pass filter is brought into coincidence with the maximum mode lambdao of the spectrum under the driving conditions, and the Ta is then varied over 20-30 deg.C with the If being constant with the transmission band width W=1nm. |
| 公开日期 | 1991-02-04 |
| 申请日期 | 1989-06-23 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/50563]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | NEC CORP |
| 推荐引用方式 GB/T 7714 | UEHARA KUNIO. Single axis mode semiconductor laser characteristic measuring apparatus. JP1991025989A. 1991-02-04. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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