Life testing device
文献类型：专利
| 作者 | KUSUNOKI HIRONORI; TAGUCHI HIDEO |
| 发表日期 | 1992-02-06 |
| 专利号 | JP1992036630A |
| 著作权人 | HITACHI LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Life testing device |
| 英文摘要 | PURPOSE:To enable temperature control and a life test with high accuracy by using insulating liquid which has high conductivity as a heat medium in a thermostatic chamber which contains a body to be tested. CONSTITUTION:The thermostatic chamber 1 is filled with inert liquid (heat medium) 5 which has good heat conductivity and provides superior electric insulation like fluorine inert liquid. The temperature of the fluorine inert liquid 5 is controlled by a temperature controller 2. In the thermostatic chamber 1, a jig 7 in wiring board structure with plural sockets is arranged and a semiconductor laser device 3 to be tested which has a photodetector for laser light monitoring inside is fitted to the jig 7. Then heat which is generated in the thermostatic chamber 1 is conducted directly to the inert liquid 5 from the surface of the package of the semiconductor laser device 3. The temperature of the inert liquid 5 is controlled to constant temperature at all times. Therefore, the temperature of the junction of a semiconductor laser chip 24 in the laser device 3 is held constant and stable laser oscillation is performed to test the life with high accuracy. |
| 公开日期 | 1992-02-06 |
| 申请日期 | 1990-05-31 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/50621]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | HITACHI LTD |
| 推荐引用方式 GB/T 7714 | KUSUNOKI HIRONORI,TAGUCHI HIDEO. Life testing device. JP1992036630A. 1992-02-06. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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