Reflecting-point measuring method
文献类型：专利
| 作者 | UNO TOMOAKI; MATSUI YASUSHI |
| 发表日期 | 1992-10-01 |
| 专利号 | JP1992276505A |
| 著作权人 | MATSUSHITA ELECTRIC IND CO LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Reflecting-point measuring method |
| 英文摘要 | PURPOSE:To obtain the distance between reflecting points and to obtain the reflectivities of the reflecting points even if the distance between a semiconductor laser and the reflecting point is very short, and even if the reflecting point is minute. CONSTITUTION:The light from a semiconductor laser which undergoes current modulation with a high-frequency power supply 13 of 100MHz passes an optical resonator 15. After the light is converted into the electric signal with a light receiving device 17, the distortion component (second-order nonlinear component) of 200MHz is observed with a spectrum analyzer 18. At this time, the temperature of the DFB-type semiconductor laser 11 is slowly changed with a temperature controlling circuit 19. Then, the oscillating wavelength is changed, and the oscillating frequency is gradually changed. As a result, the frequency characteristic of the distortion (or the temperature characteristic of the distortion) is obtained. The optical length nL between reflecting points 15a and 15b when the distortion characteristic is changed by two cycles with the temperature change deltaT is expressed by nL=DXCXdeltaT/2. Thus, the distance L between the reflecting point 15a and the reflecting point 15b can be obtained. |
| 公开日期 | 1992-10-01 |
| 申请日期 | 1991-03-04 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/50677]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MATSUSHITA ELECTRIC IND CO LTD |
| 推荐引用方式 GB/T 7714 | UNO TOMOAKI,MATSUI YASUSHI. Reflecting-point measuring method. JP1992276505A. 1992-10-01. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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