Reliability tester of semiconductor lasers
文献类型：专利
| 作者 | FUJIMARA, YASUSHI, C/O OSAKA WORKS OF SUMITOMO; YOSHIMURA, MANABU, C/O OSAKA WORKS OF SUMITOMO; TERAUCHI, HITOSHI, C/O OSAKA WORKS OF SUMITOMO |
| 发表日期 | 1994-12-14 |
| 专利号 | EP0628830A2 |
| 著作权人 | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
| 国家 | 欧洲专利局 |
| 文献子类 | 发明申请 |
| 其他题名 | Reliability tester of semiconductor lasers |
| 英文摘要 | Conventionally Ge photodiodes have been employed as photodetectors for the reliability test of the semiconductor lasers of a 0 µm and 6 µm wavelength, since Ge photodiodes have wide receiving regions with high sensitivity for the range of wavelength. A large dark current flows in a Ge photodiode at a high temperature. Thus, Ge photodiodes must be cooled. Also the sample lasers are heated to accelerate the test. The lasers and the Ge photodiodes require two independent thermostats, and fiber rods are used to connect the Ge photodiodes to the lasers. The present invention uses InGaAs photodiodes (21) as photodetectors. The InGaAs photodiodes (21) and sample lasers (11) can be placed face to face in the same thermostat (1). Several pairs of a laser and a InGaAs photodiode can be aligned in the axial direction in the thermostat. A saving in the packing space per sample increases the number of lasers which can be examined in a test cycle. |
| 公开日期 | 1994-12-14 |
| 申请日期 | 1994-03-31 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/50885]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | SUMITOMO ELECTRIC INDUSTRIES, LTD. |
| 推荐引用方式 GB/T 7714 | FUJIMARA, YASUSHI, C/O OSAKA WORKS OF SUMITOMO,YOSHIMURA, MANABU, C/O OSAKA WORKS OF SUMITOMO,TERAUCHI, HITOSHI, C/O OSAKA WORKS OF SUMITOMO. Reliability tester of semiconductor lasers. EP0628830A2. 1994-12-14. |
入库方式： OAI收割
来源：西安光学精密机械研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。