Method and device for measuring the waveform of an optical signal
文献类型：专利
| 作者 | FUTAMI, FUMIO; WATANABE, SHIGEKI |
| 发表日期 | 2003-01-02 |
| 专利号 | US20030002833A1 |
| 著作权人 | FUJITSU LIMITED |
| 国家 | 美国 |
| 文献子类 | 发明申请 |
| 其他题名 | Method and device for measuring the waveform of an optical signal |
| 英文摘要 | According to the present invention, a nonlinear optical loop mirror is provided, which includes a first optical coupler including first and second optical paths directionally coupled to each other, a loop optical path formed of a nonlinear optical medium for connecting the first and second optical paths, and a second optical coupler including a third optical path directionally coupled to the loop optical path. An optical signal whose waveform is to be measured is supplied into the nonlinear optical loop mirror from the first optical path. An optical trigger having a predetermined pulse width is supplied into the nonlinear optical loop mirror from the third optical path. Information on the waveform of the optical signal is obtained according to light output from the second optical path. The predetermined pulse width is set according to a required measurement accuracy. According to this method, the pulse width of the optical trigger is set according to the required measurement accuracy, so that the waveform of the optical signal can be faithfully observed with a high time resolution. |
| 公开日期 | 2003-01-02 |
| 申请日期 | 2001-12-12 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/52600]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | FUJITSU LIMITED |
| 推荐引用方式 GB/T 7714 | FUTAMI, FUMIO,WATANABE, SHIGEKI. Method and device for measuring the waveform of an optical signal. US20030002833A1. 2003-01-02. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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