Optical probe for wafer scale testing of light-electrical (l-i-v) performance of opto electronic devices
文献类型：专利
| 作者 | LAM, YEE LOY; CHAN, YUEN CHUEN; CHOO, LAY CHENG; NG, SENG LEE |
| 发表日期 | 2005-03-03 |
| 专利号 | US20050047715A1 |
| 著作权人 | LAM YEE LOY |
| 国家 | 美国 |
| 文献子类 | 发明申请 |
| 其他题名 | Optical probe for wafer scale testing of light-electrical (l-i-v) performance of opto electronic devices |
| 英文摘要 | A method of testing an edge-emitting or edge-coupled opto-electronic device comprises the step of aligning an optical probe with an optical interface of the device so that light is coupled between the optical interface and the optical probe, wherein the optical probe comprises an optical fibre having a light turning structure at a distal tip that changes the direction of propagation of light incident on the light turning structure. |
| 公开日期 | 2005-03-03 |
| 申请日期 | 2002-11-18 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/52912]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | LAM YEE LOY |
| 推荐引用方式 GB/T 7714 | LAM, YEE LOY,CHAN, YUEN CHUEN,CHOO, LAY CHENG,et al. Optical probe for wafer scale testing of light-electrical (l-i-v) performance of opto electronic devices. US20050047715A1. 2005-03-03. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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