Device and method for measuring scattering of radiation
文献类型：专利
| 作者 | JONES, ROBERT; SEWELL, ROGER FANE; RYDER, PAUL D.; HAYES, MATTHEW J.; CARTER, EDWIN C. |
| 发表日期 | 2012-04-05 |
| 专利号 | US20120080611A1 |
| 著作权人 | CAMBRIDGE CONSULTANTS LIMITED |
| 国家 | 美国 |
| 文献子类 | 发明申请 |
| 其他题名 | Device and method for measuring scattering of radiation |
| 英文摘要 | A photometric device for investigating a sample, comprises an array of radiation sources that are spaced apart from one another, and which are operable to generate radiation that differs from that generated by the other radiation sources in the array. The device includes a lens arrangement for focusing the radiation at a region of space where a sample may be located for example by means of a sample holder, and at least one detector for receiving radiation from the region of space. Preferably, a number of detectors are employed that are spaced apart from one another, and especially about an axis of the device, so that one radiation detector can detect radiation transmitted by the sample and the other detectors can detect radiation scattered by it. The radiation sources may be time division multiplexed so that in each time slot the detectors receive radiation originating from each radiation source. In an alternative embodiment, the radiation from the region of space may be transmitted to the sample via a beam homogeniser, for example an optical waveguide in the form of an optical fibre, which may be used to reduce or remove speckle where laser diodes are employed as the radiation sources. The device may be used to determine the particle size distribution of particles in a sample by a method employing Bayesian inference. |
| 公开日期 | 2012-04-05 |
| 申请日期 | 2009-02-02 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/58388]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | CAMBRIDGE CONSULTANTS LIMITED |
| 推荐引用方式 GB/T 7714 | JONES, ROBERT,SEWELL, ROGER FANE,RYDER, PAUL D.,et al. Device and method for measuring scattering of radiation. US20120080611A1. 2012-04-05. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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