中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optical device for adjustement and oscillation wavelength measurement of laser diode unit

文献类型:专利

作者TOMITA SATORU; KANEKO YUTAKA; IMAGAWA SUSUMU
发表日期1986-02-19
专利号JP1986035328A
著作权人RICOH CO LTD
国家日本
文献子类发明申请
其他题名Optical device for adjustement and oscillation wavelength measurement of laser diode unit
英文摘要PURPOSE:To make an optical axis adjustement and a collimating adjustment and also take a measurement of oscillation wavelength easily with high accuracy only by instaling an LD (laser diode) unit to be adjusted and measured on a base plate once. CONSTITUTION:A diffraction grating 11 whose grating interval is already know is provided as a means for measuring the wavelength of the LD and a wavelength skip in the middle of the optical path extending from a half-mirror 14 to a position sensor 15 for optical axis adjustment, and a position sensor (CCD)12 for oscillation wavelength measurement is provided on the optical path of the diffracted light of laser luminous flux transmitted through the mirror 14. Then, a lens 18 is provided to the circuit of the diffracted light, which is made incident on the CCD. Then, the LD unit 10 is only installed on the adjustement and measurement base 13 once, and then the optical axis adjustement is made by measuring the incidence position of the sensor 15 as to luminous flux which is transmitted through the mirror 14 and not diffracted by the grating 11 and the collimating adjustement is made by measuring the beam diameter of luminous flux which is reflecting by the mirror 14 and converted by a lens 16 by the CCD. Further, the incidence position on the sensor 12 through the grating 11 is measured to calculate the wavelength, etc., of the LD.
公开日期1986-02-19
申请日期1984-07-27
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/59377]  
专题半导体激光器专利数据库
作者单位RICOH CO LTD
推荐引用方式
GB/T 7714
TOMITA SATORU,KANEKO YUTAKA,IMAGAWA SUSUMU. Optical device for adjustement and oscillation wavelength measurement of laser diode unit. JP1986035328A. 1986-02-19.

入库方式: OAI收割

来源:西安光学精密机械研究所

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