An apparatus for measuring an optical characteristic of an examined lens
文献类型：专利
| 作者 | KAJINO, TADASHI; HIKOSAKA, YASUMI; FUJIEDA, MASANAO; UENO, TOKIO |
| 发表日期 | 1998-11-11 |
| 专利号 | EP0877241A2 |
| 著作权人 | NIDEK CO., LTD. |
| 国家 | 欧洲专利局 |
| 文献子类 | 发明申请 |
| 其他题名 | An apparatus for measuring an optical characteristic of an examined lens |
| 英文摘要 | An apparatus for measuring an optical characteristic of an examined lens, comprising a first measuring optical system for projecting a first measuring light flux on an examined lens, which is enlarged so as to cover a relative large area of the lens, via both a first grating and a second grating which has a predetermined positional relationship with the first grating, thereby forming moire fringes thereon, then detecting the moire fringes by a two dimensional photo detector, a first calculating device for calculating each principle point refractive power at each point of the lens by processing results detected by the first measuring optical system, a second measuring optical system for projecting a second measuring light flux on a small area of the lens, then detecting a position of an image of the second measuring light flux by a positional photo-detector, a second calculating device for calculating a back vertex power at the small area by processing results detected by the second measuring optical system, and a display device for obtaining a distribution of each back vertex power at each point of the lens based on both the back vertex power and the each principle point refractive power, then displaying it graphically. |
| 公开日期 | 1998-11-11 |
| 申请日期 | 1998-05-07 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62451]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | NIDEK CO., LTD. |
| 推荐引用方式 GB/T 7714 | KAJINO, TADASHI,HIKOSAKA, YASUMI,FUJIEDA, MASANAO,et al. An apparatus for measuring an optical characteristic of an examined lens. EP0877241A2. 1998-11-11. |
入库方式： OAI收割
来源：西安光学精密机械研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。