Transmission line loss testing method, slave station using the method, master station, and communication system
文献类型:专利
作者 | NAGAYAMA, AKIRA, FUJITSU LIMITED; SHIMIZU, KAZUYOSHI, FUJITSU LIMITED |
发表日期 | 2006-05-03 |
专利号 | EP1309097A4 |
著作权人 | FUJITSU LIMITED |
国家 | 欧洲专利局 |
文献子类 | 发明申请 |
其他题名 | Transmission line loss testing method, slave station using the method, master station, and communication system |
英文摘要 | A transmission line testing method for testing the transmission loss between a master station and a slave station additionally provided to a star communication system, a slave station using the method, a master station, and an optical communication system. In a transmission line under test of a star communication system, the power of a signal is measured at a second end to which a slave station to be provided additionally is connected and a first end other than the second end by second and first measuring means respectively, and the result of the measurement at the first end is stored in storage means. Alternatively, the result of the measurement at the first end is transmitted to accommodating means by transferring means. The accommodating means accommodates the result of the measurement at the first end in a downstream signal and transmits it to the slave station. In the slave station, information extracting means extracts the result of the measurement at the first end from the downstream signal, and processing means calculates the difference between the measurement results at the first and second ends, thereby calculating the transmission loss of the transmission line under test between the first and second ends. |
公开日期 | 2006-05-03 |
申请日期 | 2000-06-30 |
状态 | 失效 |
源URL | [http://ir.opt.ac.cn/handle/181661/62461] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | FUJITSU LIMITED |
推荐引用方式 GB/T 7714 | NAGAYAMA, AKIRA, FUJITSU LIMITED,SHIMIZU, KAZUYOSHI, FUJITSU LIMITED. Transmission line loss testing method, slave station using the method, master station, and communication system. EP1309097A4. 2006-05-03. |
入库方式: OAI收割
来源:西安光学精密机械研究所
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