中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Transmission line loss testing method, slave station using the method, master station, and communication system

文献类型:专利

作者NAGAYAMA, AKIRA, FUJITSU LIMITED; SHIMIZU, KAZUYOSHI, FUJITSU LIMITED
发表日期2006-05-03
专利号EP1309097A4
著作权人FUJITSU LIMITED
国家欧洲专利局
文献子类发明申请
其他题名Transmission line loss testing method, slave station using the method, master station, and communication system
英文摘要A transmission line testing method for testing the transmission loss between a master station and a slave station additionally provided to a star communication system, a slave station using the method, a master station, and an optical communication system. In a transmission line under test of a star communication system, the power of a signal is measured at a second end to which a slave station to be provided additionally is connected and a first end other than the second end by second and first measuring means respectively, and the result of the measurement at the first end is stored in storage means. Alternatively, the result of the measurement at the first end is transmitted to accommodating means by transferring means. The accommodating means accommodates the result of the measurement at the first end in a downstream signal and transmits it to the slave station. In the slave station, information extracting means extracts the result of the measurement at the first end from the downstream signal, and processing means calculates the difference between the measurement results at the first and second ends, thereby calculating the transmission loss of the transmission line under test between the first and second ends.
公开日期2006-05-03
申请日期2000-06-30
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/62461]  
专题半导体激光器专利数据库
作者单位FUJITSU LIMITED
推荐引用方式
GB/T 7714
NAGAYAMA, AKIRA, FUJITSU LIMITED,SHIMIZU, KAZUYOSHI, FUJITSU LIMITED. Transmission line loss testing method, slave station using the method, master station, and communication system. EP1309097A4. 2006-05-03.

入库方式: OAI收割

来源:西安光学精密机械研究所

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