Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level
文献类型：专利
| 作者 | TAKEUCHI, HIDEO; YAMAMOTO, YOSHITSUGU |
| 发表日期 | 2006-05-04 |
| 专利号 | US20060094133A1 |
| 著作权人 | MITSUBISHI DENKI KABUSHIKI KAISHA |
| 国家 | 美国 |
| 文献子类 | 发明申请 |
| 其他题名 | Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level |
| 英文摘要 | A pump beam irradiates the surface of a semiconductor sample through modulator while irradiating the surface with a probe beam so that a detector measures a light-modulated spectrum of the probe beam reflected from the surface of the semiconductor sample. Then, surface electric field strength is calculated from the period of Franz-Keldysh oscillations appearing in the light-modulated spectrum, and the surface recombination velocity and surface Fermi level are calculated based on a relation between the surface electric field strength and the probe beam power density. |
| 公开日期 | 2006-05-04 |
| 申请日期 | 2005-10-24 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62500]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MITSUBISHI DENKI KABUSHIKI KAISHA |
| 推荐引用方式 GB/T 7714 | TAKEUCHI, HIDEO,YAMAMOTO, YOSHITSUGU. Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level. US20060094133A1. 2006-05-04. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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