中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method

文献类型:专利

作者MATSUDA, KYOKO; OKUMURA, TOSHIYUKI
发表日期2013-01-10
专利号US20130010294A1
著作权人SHARP KABUSHIKI KAISHA
国家美国
文献子类发明申请
其他题名Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method
英文摘要There is provided an optical measurement analysis device capable of applying light to substantially the entire surface of a to-be-analyzed object for improving the analysis accuracy. The optical measurement analysis device according to the present embodiment includes a container, a light source, a light irradiation unit, a light reception unit, a spectroscope unit, and an analyzing unit for analyzing an optical spectrum obtained by the spectroscope unit. The container has an inner wall adapted to reflect light reflected by the to-be-analyzed object and light transmitted therethrough.
公开日期2013-01-10
申请日期2012-06-22
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/62545]  
专题半导体激光器专利数据库
作者单位SHARP KABUSHIKI KAISHA
推荐引用方式
GB/T 7714
MATSUDA, KYOKO,OKUMURA, TOSHIYUKI. Optical measurement analysis device, storage room, electromagnetic-wave generating device, and optical measurement analysis method. US20130010294A1. 2013-01-10.

入库方式: OAI收割

来源:西安光学精密机械研究所

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