Noise characteristics evaluation of semiconductor laser
文献类型：专利
| 作者 | TAMATOSHI KUNIYOSHI; YAMASHITA KOJI |
| 发表日期 | 1986-05-20 |
| 专利号 | JP1986102079A |
| 著作权人 | MITSUBISHI ELECTRIC CORP |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Noise characteristics evaluation of semiconductor laser |
| 英文摘要 | PURPOSE:To determine the noise characteristics in a short time, by measuring the oscillation spectrum of a semiconductor laser, and obtaining the mode ratio between the intensity at the maximum peak and the intensity at the secondly intensive peak adjacent to the maximum peak. CONSTITUTION:When the slow starter power source is turned on, the semiconductor laser 14 to be measured oscillates, with its emission light entering a photo- spectrum analyzer 15; then the analizer indicates the spectrum of the oscillated light. The ratio X/Y (mode ratio) between the intensity X at the maximum peak and the intensity Y at the secondly intensive peak adjacent to the maximum intensity X of the spectrum is obtained, with the result that the noise characteristics is determined in a short time since the smaller the mode ratio, the better noise characteristics has the semiconductor laser 14. |
| 公开日期 | 1986-05-20 |
| 申请日期 | 1984-10-25 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62597]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MITSUBISHI ELECTRIC CORP |
| 推荐引用方式 GB/T 7714 | TAMATOSHI KUNIYOSHI,YAMASHITA KOJI. Noise characteristics evaluation of semiconductor laser. JP1986102079A. 1986-05-20. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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