Far-field pattern measuring device using semiconductor light-emitting element
文献类型：专利
| 作者 | WATANABE HIROHIDE; TAKADA TOSHIHIRO |
| 发表日期 | 1988-07-04 |
| 专利号 | JP1988160290A |
| 著作权人 | FUJITSU LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Far-field pattern measuring device using semiconductor light-emitting element |
| 英文摘要 | PURPOSE:To shorten the time required for measuring by a method wherein photodetectors are arranged equidistantly from a light-emitting element. CONSTITUTION:On a hemisphere with a light-emitting element positioned at its center, photodetectors SW1, SW2...SWn are successively arranged on a horizontal plane while, on a vertical plane, photodetectors SV1, SV2...SVn are successively arranged. A controlling system 4 actuates a switch 1 for scanning the multiplicity of the photodetectors, the current values are measured one after the other, and the result is exhibited on a display 3 in the form of a chart. This method ensures a prompt measurement of all the values in a very short period of time. |
| 公开日期 | 1988-07-04 |
| 申请日期 | 1986-12-23 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62607]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | FUJITSU LTD |
| 推荐引用方式 GB/T 7714 | WATANABE HIROHIDE,TAKADA TOSHIHIRO. Far-field pattern measuring device using semiconductor light-emitting element. JP1988160290A. 1988-07-04. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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