Measuring instrument for semiconductor laser characteristics
文献类型：专利
| 作者 | SAITO TETSUO; MURASAWA YOSHIHIRO; KUGE TSUKASA |
| 发表日期 | 1988-08-12 |
| 专利号 | JP1988195538A |
| 著作权人 | CANON INC |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Measuring instrument for semiconductor laser characteristics |
| 英文摘要 | PURPOSE:To accurately and easily measure the far field pattern characteristics of a semiconductor laser by positioning the semiconductor laser and a photodetector optically. CONSTITUTION:A measuring instrument capable of measuring the far field pattern characteristics of the laser detects position shifts between semiconductor lasers 1-3 and a photodetector (photosensor) 4. Then the semiconductor lasers 1-3 are positioned by being moved in a 1st or 2nd direction in hetero-junction surfaces of the semiconductor lasers 1-3 relatively to the photosensor 4. Then, while the photosensor 4 rotated around 1st and 2nd directions relatively to the semiconductor lasers 1-3, a rotational angle-light quantity distribution is measured. Data regarding respective measured characteristics are processed properly and statistically together with temperature conditions and outputted on a CRT. Consequently, the far field pattern characteristics of the semiconductor lasers can be measured. |
| 公开日期 | 1988-08-12 |
| 申请日期 | 1987-02-10 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62608]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | CANON INC |
| 推荐引用方式 GB/T 7714 | SAITO TETSUO,MURASAWA YOSHIHIRO,KUGE TSUKASA. Measuring instrument for semiconductor laser characteristics. JP1988195538A. 1988-08-12. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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