Method and apparatus for measuring mode distribution characteristics of laser diode
文献类型：专利
| 作者 | MORI MASAKAZU; TSUDA TAKASHI; YAMANE KAZUO |
| 发表日期 | 1988-01-19 |
| 专利号 | JP1988012186A |
| 著作权人 | FUJITSU LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Method and apparatus for measuring mode distribution characteristics of laser diode |
| 英文摘要 | PURPOSE:To measure mode distribution characteristics of a laser diode in a state approximate to an actual driving, by applying a PN (Pseudo Noise) pattern to the modulation of the laser diode to be measured in the case of measurement of various parameters necessary to calculate the K value. CONSTITUTION:A laser diode LD is modulated applying a PN pattern 21 of PN (Pseudo Noise) period NT, where N is the bit length of a period of the PN pulse pattern and T is a bit period. The relative value of a power of a specified longitudinal mode to the total longitudinal mode is measured. Line spectrum components and continuous spectrum components of the specified longitudinal mode are measured, and mode distribution characteristics of the laser diode LD are measured according to a coefficient determined by the measured values and N of the PN. By using the PN pulse pattern in this manner, circumstances more approximate to an actual data pattern can be reproduced. |
| 公开日期 | 1988-01-19 |
| 申请日期 | 1987-03-04 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62609]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | FUJITSU LTD |
| 推荐引用方式 GB/T 7714 | MORI MASAKAZU,TSUDA TAKASHI,YAMANE KAZUO. Method and apparatus for measuring mode distribution characteristics of laser diode. JP1988012186A. 1988-01-19. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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