Measuring device for semiconductor laser
文献类型：专利
| 作者 | NAKANO MUNEAKI; WADA MASARU |
| 发表日期 | 1989-07-26 |
| 专利号 | JP1989186694A |
| 著作权人 | MATSUSHITA ELECTRIC IND CO LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Measuring device for semiconductor laser |
| 英文摘要 | PURPOSE:To measure the expansion angle of a laser beam in the state of a chip, by mounting a detector through which a rear light can be measured by the expansion angle when the inspected of a semiconductor laser is made. CONSTITUTION:A chip-like semiconductor laser 2 is sucked by a vacuum pincette 1 and is set on an electrode 3. This device allows the vacuum pincette 1 to serve as one of the electrodes and a pulse voltage to be impressed between this electrode and the other electrode 3. Then, the value of a current flowing in the semiconductor laser device is measured to obtain current-voltage characteristics. Simultaneously, light output in the forward is measured by a detector 4 for measuring light output to obtain current-light output characteristics. On the other hand, in a state that a constant voltage is applied to the chip of the laser device by pulse, a far-field pattern in the horizontal direction is measured by turning in the direction of the arrow A circular-arcwise a movable detector 5 for measuring the far-field pattern that is arranged and mounted in the rear side and the far-field pattern in the vertical direction is measured by turning the detector 5 in the direction of the arrow B. In this way, the expansion angle of the beam can be measured from a half value angle for its far-field pattern. |
| 公开日期 | 1989-07-26 |
| 申请日期 | 1988-01-14 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62616]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MATSUSHITA ELECTRIC IND CO LTD |
| 推荐引用方式 GB/T 7714 | NAKANO MUNEAKI,WADA MASARU. Measuring device for semiconductor laser. JP1989186694A. 1989-07-26. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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