Method and device for measuring characteristic of laser diode
文献类型：专利
| 作者 | KASAHARA MASAO; NEGISHI HIDEHIKO; WAKABAYASHI SHINICHI |
| 发表日期 | 1989-09-01 |
| 专利号 | JP1989219574A |
| 著作权人 | MATSUSHITA ELECTRIC IND CO LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Method and device for measuring characteristic of laser diode |
| 英文摘要 | PURPOSE:To securely protect a laser diode against a surge and to shorten the required measurement time for each diode by short-circuiting both ends of the laser diode at the start and end of electric feeding. CONSTITUTION:One-terminal sides of laser diodes 11, 12..., 1N to be measured are connected to a power terminal through the 1st switch 2 of the N contact of one circuit and a protective resistor 3 and the other-terminal sides are connected mutually and connected to a power terminal 6 through a protective resistor 5. Then it is confirmed that 2nd switches 71, 72...7N connected to the diodes 11, 12..., 1N are closed and then when the diode 11 is measured, the switch 2 is switched to a contact P1 and only the switch 71 among the switches 71, 72...7N is turned off; and a driving current is increased gradually and the characteristics are measured. Then the switch 71 is turned on again after the measurement to protect the diode 11 against a surge current. |
| 公开日期 | 1989-09-01 |
| 申请日期 | 1988-02-26 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62617]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | MATSUSHITA ELECTRIC IND CO LTD |
| 推荐引用方式 GB/T 7714 | KASAHARA MASAO,NEGISHI HIDEHIKO,WAKABAYASHI SHINICHI. Method and device for measuring characteristic of laser diode. JP1989219574A. 1989-09-01. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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