Measuring device for semiconductor laser characteristic
文献类型：专利
| 作者 | NAKANO YOSHINORI; IWANE GANZOU |
| 发表日期 | 1985-09-21 |
| 专利号 | JP1985186078A |
| 著作权人 | NIPPON DENSHIN DENWA KOSHA |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Measuring device for semiconductor laser characteristic |
| 英文摘要 | PURPOSE:To measure the temperature characteristic of a drive current simply and accurately by providing a system controller which includes a feedback circuit for holding the light output constant and a temperature controller for controlling the temperature of a constant-temperature oven. CONSTITUTION:A semiconductor laser 1 is filled in a constant-temperature oven 7, driven by a suitable current, and the laser is set to an accurate position while monitoring the light output by a photodetector 2. Then, the input current to the laser 1 is regulated through a system controller 4 so that a signal detected by a load resistor 3 becomes a desired light output. The temperature of the oven is set to the lowest temperature of the measuring temperature range, and raised at the certain constant rate. The light output from the laser 1 decreases when the temperature rises. Accordingly, to maintain the light output constant, the drive current is raised to control, and the temperature characteristic of the drive current is recorded simultaneously on the recorder 9. The temperature is raised, to the maximum limit temperature capable of maintaining the constant light output by the rise of the current, and the measurement is then finished. Thus, the temperature characteristic at the constant output drive time can be measured at one temperature scanning. |
| 公开日期 | 1985-09-21 |
| 申请日期 | 1984-03-05 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62912]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | NIPPON DENSHIN DENWA KOSHA |
| 推荐引用方式 GB/T 7714 | NAKANO YOSHINORI,IWANE GANZOU. Measuring device for semiconductor laser characteristic. JP1985186078A. 1985-09-21. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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