Measurement apparatus for semiconductor laser
文献类型：专利
| 作者 | SEKO ICHIRO; MATSUMURA HIROYOSHI |
| 发表日期 | 1986-11-05 |
| 专利号 | JP1986248490A |
| 著作权人 | HITACHI LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Measurement apparatus for semiconductor laser |
| 英文摘要 | PURPOSE:To select a semiconductor laser which has a high coupling efficiency with an optical fiber with a high yield only by measuring a light power transmitted through a Gaussian distribution filter inserted between the semiconductor laser and a detector. CONSTITUTION:Only a Gaussian component of a laser beam of a semiconductor laser is taken out by inserting a Gaussian distribution filter into a measurement apparatus. For instance, the apparatus consists of a semiconductor laser 1, a Gaussian distribution filter 2 and a detector 3. If necessary, a lens 4 may be inserted between (1) and (2) or between (2) and (3). The Gaussian distribution filter is produced in such a manner that a portion 6 whose refractive index is 4702 and radius is 28.8mum is formed at the center part of a glass plate 5 whose refractive index is 4701 by ion exchange. Then, in order to make the numerical aperture of the Gaussian filter agree with the numerical aperture of an optical fiber (NA=0.1), a metal film 7 is evaporated on the surface of the filter and a circular window which forms concentric circles with the center part 6 of the glass and has a radius of 50mum is formed in the metal film 7. The distance from the semiconductor laser 1 to the surface of the Gaussian distribution filter 2 is 500mum. |
| 公开日期 | 1986-11-05 |
| 申请日期 | 1985-04-26 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62981]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | HITACHI LTD |
| 推荐引用方式 GB/T 7714 | SEKO ICHIRO,MATSUMURA HIROYOSHI. Measurement apparatus for semiconductor laser. JP1986248490A. 1986-11-05. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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