中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Forming method for resist pattern

文献类型:专利

作者TSUJI SHINJI; OKAI MAKOTO; HATTORI SHINICHI; HIRAO MOTONAO; OISHI AKIO; MATSUMURA HIROYOSHI
发表日期1987-04-18
专利号JP1987084515A
著作权人HITACHI LTD
国家日本
文献子类发明申请
其他题名Forming method for resist pattern
英文摘要PURPOSE:To obtain a diffraction element whose phase is inverted in the middle, by applying a negative resist and a positive resist separately on the surface of a solid by a liftoff method. CONSTITUTION:An Az positive resist 2 and a spacer 3 formed of spin-on glass are applied on a substrate 1, and after heat treatment is conducted, an AZ positive resist is applied. Next, the resist 4 is patterned. After the spacer 3 is patterned, the exposed portion of the resist 2 and the resist 4 are removed. Then, after a negative resist 5 is applied separately, the spacer 3 is etched, part of the negative resist 5 is lifted off, and thus the coats of the positive resist 2 and the negative resist 5 are provided separately and alternately on the substrate The resists thus prepared are subjected to exposure and development, and thereby a diffraction grating having a phase shift of pi spatially is obtained.
公开日期1987-04-18
申请日期1985-10-09
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/64714]  
专题半导体激光器专利数据库
作者单位HITACHI LTD
推荐引用方式
GB/T 7714
TSUJI SHINJI,OKAI MAKOTO,HATTORI SHINICHI,et al. Forming method for resist pattern. JP1987084515A. 1987-04-18.

入库方式: OAI收割

来源:西安光学精密机械研究所

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