中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Manufacture of high-resistance indium phosphide semiconductor layer

文献类型:专利

作者KONDO MASATO
发表日期1987-10-08
专利号JP1987230018A
著作权人FUJITSU LTD
国家日本
文献子类发明申请
其他题名Manufacture of high-resistance indium phosphide semiconductor layer
英文摘要PURPOSE:To obtain an InP layer of sufficiently high concentration by covering a substrate with a crystal plate including P before liquid phase epitaxy of the InP layer and growing the InP layer at a specified temperature after removing said crystal plate. CONSTITUTION:Iron is added in a solution for epitaxial growth as an additional matter. After covering an InP substrate 2 with a crystal plate 4 including P, the crystal plate 4 is removed from the substrate 2 and the solution for epitaxial growth 5 is brought to the substrate 2. Then, an InP layer is grown at a temperature above 800 deg.C. Namely, an InP substrate 2 is put on a boat 1 made of high-purity carbon firstly before the growth and then it is covered with the InP crystal plate 4 for protecting the substrate covers. Next, a slider 3 on the boat 1 is moved by a pushing bar 8 to remove the crystal plate 4 from the substrate 2 and to bring the epitaxial growth solution 5 added with Fe. Then, an InP thin film is grown at a temperature above 800 deg.C. By this growth, an InP thin film having sufficiently high resistance can be obtained.
公开日期1987-10-08
申请日期1986-03-31
状态失效
源URL[http://ir.opt.ac.cn/handle/181661/67285]  
专题半导体激光器专利数据库
作者单位FUJITSU LTD
推荐引用方式
GB/T 7714
KONDO MASATO. Manufacture of high-resistance indium phosphide semiconductor layer. JP1987230018A. 1987-10-08.

入库方式: OAI收割

来源:西安光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。