Surface-light-emitting semiconductor laser apparatus with monitor
文献类型：专利
| 作者 | FUKUNAGA TOSHIAKI; TAKAMORI TAKESHI; NONAKA TOSHIO |
| 发表日期 | 1991-12-13 |
| 专利号 | JP1991283688A |
| 著作权人 | OKI ELECTRIC IND CO LTD |
| 国家 | 日本 |
| 文献子类 | 发明申请 |
| 其他题名 | Surface-light-emitting semiconductor laser apparatus with monitor |
| 英文摘要 | PURPOSE:To reduce a size and raise output by sharing one of electrodes of a detecting element with a lower electrode on a lower face of a substrate and making the other electrode a total reflection electrode on a surface of a principal part. CONSTITUTION:A tilted reflection mirror provided on one end of a horizontal active waveguide path 61 of a laser oscillator body 60 is tilted by 45 deg. with respect to a substrate surface so that it serves as a total reflection mirror for laser light which guides the horizontal active waveguide path. A hole is provided on a substrate below the reflection mirror 65, while a detecting element 70 is built on the laser oscillator body exposed at this hole and its electrode 78 is made a total reflection mirror for incident laser light. Thus the body 60 and the element 70 are located vertically so that an area occupied by a laser apparatus on the substrate surface is small. In addition this structure constitutes a laser resonator between a laser light outgoing window 67 and a total reflection surface of the electrode of the element 70. Therefore since the electrode 78 of the element 70 totally reflects laser light toward the body 60, oscillation output from the outgoing window 67 can be increased, and since the laser light passes through a principal part of the element 70, light for monitoring can be also detected as well. |
| 公开日期 | 1991-12-13 |
| 申请日期 | 1990-03-30 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/67485]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | OKI ELECTRIC IND CO LTD |
| 推荐引用方式 GB/T 7714 | FUKUNAGA TOSHIAKI,TAKAMORI TAKESHI,NONAKA TOSHIO. Surface-light-emitting semiconductor laser apparatus with monitor. JP1991283688A. 1991-12-13. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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