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文献类型：专利
| 作者 | AKYAMA KOJI; IWAOKA HIDETO |
| 发表日期 | 1993-07-23 |
| 专利号 | JP1993049055B2 |
| 著作权人 | YOKOGAWA ELECTRIC CORP |
| 国家 | 日本 |
| 文献子类 | 授权发明 |
| 其他题名 | - |
| 英文摘要 | PURPOSE:To improve the accuracy and resolution of an optical frequency spectrum analyzer by performing the heterodyne detection of light to be measured by using the light output of a variable wavelength light source with a marker. CONSTITUTION:When the light of frequency omegai to be measured is incident on a polarization control part 1, the light output of the polarization control part 1 is amplified by an optical amplifier 2 and multiplexed with the output light of frequency omega0 of the variable wavelength light source part 10 with the maker by a half-mirror HM1, and the composite light is converted by an optical heterodyne detection part 4 into an electric signal of difference frequency omega0-omegai between both frequencies. The electric output of the optical heterodyne detection part 4 passes through a band-pass filter 5 partially and is led out as power by; a detection part 6. A signal processing and display part 7 inputs the electric output of the detection part 6 as a power signal and displays the light 71 to be measured and reference light 72 as spectra. |
| 公开日期 | 1993-07-23 |
| 申请日期 | 1986-08-13 |
| 状态 | 失效 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/70369]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | YOKOGAWA ELECTRIC CORP |
| 推荐引用方式 GB/T 7714 | AKYAMA KOJI,IWAOKA HIDETO. -. JP1993049055B2. 1993-07-23. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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