Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation
文献类型：期刊论文
| 作者 | Guo, Xiaopeng1,3; Zhang, Miaomiao1,2,3 ; Liu, Ruiyuan1,2,3; Gao, Yue1,3; Yang, Yang3; Li, Wenjian2,3; Lu, Dong2,3
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| 刊名 | WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY
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| 出版日期 | 2019-01 |
| 卷号 | 35页码:1 |
| 关键词 | Radiation damage Double-strand breaks Cellular recovery dynamics Phenotypic and transcriptional profiles Saccharomyces cerevisiae |
| ISSN号 | 0959-3993 |
| DOI | 10.1007/s11274-018-2566-9 |
| 英文摘要 | In this study, we examined the dynamics of phenotypic and transcriptional profiles in Saccharomyces cerevisiae following semi-lethal X-ray irradiation. Post-irradiation, reproductive death was revealed as the predominant form of death in S. cerevisiae and almost all the irradiated cells were physically present and intact. In addition, cell cycle arrest reached its peak and cell division was at its valley at 2h. Cell cycle arrest, cell division potential, DNA damage, and mitochondrial transmembrane potential (MTP) showed significant recovery at 4h (P>0.05 vs. control). The improvements of DNA damage and MTP decrease were evaluated as at least 77% and 84% for the original irradiated cells at 4h, respectively. In the transcriptional profile, the amount of differentially expressed genes (DEGs) and the fold change in the repair-related DEGs were highest at 1h post-irradiation and then decreased. The DEGs at 1h (but not 2h or 3h) were significantly enriched in gene ontology (GO) categories of detoxification (up) and antioxidant activity (up). Although the transcriptional profile supported the repair time frame observed in the phenotypic profile, the complete repair may take a longer duration as the transcriptional levels of several important repair-related DEGs did not show a decrease and the DNA repair-related pathways (up) were the major enriched pathway in Kyoto Encyclopaedia of Genes and Genomes pathway analysis throughout the whole course of the study. These results provide an important reference for the selection of key time points in further studies. |
| WOS关键词 | INDUCED DNA-DAMAGE ; IONIZING-RADIATION ; REPRODUCTIVE DEATH ; STRAND BREAKS ; PROTEIN ; MECHANISMS ; GENERATION |
| 资助项目 | Industrial Technology Research Institute[CAS-ITRI 201801] |
| WOS研究方向 | Biotechnology & Applied Microbiology |
| 语种 | 英语 |
| WOS记录号 | WOS:000452770100001 |
| 出版者 | SPRINGER |
| 源URL | [http://119.78.100.186/handle/113462/64462]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Lu, Dong |
| 作者单位 | 1.Univ Chinese Acad Sci, Coll Life Sci, Beijing 100049, Peoples R China 2.Key Lab Microbial Resources Exploitat & Applicat, Lanzhou 730000, Gansu, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China |
| 推荐引用方式 GB/T 7714 | Guo, Xiaopeng,Zhang, Miaomiao,Liu, Ruiyuan,et al. Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation[J]. WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY,2019,35:1. |
| APA | Guo, Xiaopeng.,Zhang, Miaomiao.,Liu, Ruiyuan.,Gao, Yue.,Yang, Yang.,...&Lu, Dong.(2019).Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation.WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY,35,1. |
| MLA | Guo, Xiaopeng,et al."Repair characteristics and time-dependent effects in Saccharomyces cerevisiae cells after X-ray irradiation".WORLD JOURNAL OF MICROBIOLOGY & BIOTECHNOLOGY 35(2019):1. |
入库方式： OAI收割
来源：近代物理研究所
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