Local structural changes induced by ion bombardment in magnetron sputtered ZnO: Al films: Raman, XPS, and XAS study
文献类型:期刊论文
作者 | Meng, Fanping; Ge, Fangfang; Chen, Yuyun; Xu, Genbao; Huang, Feng |
刊名 | SURFACE & COATINGS TECHNOLOGY
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出版日期 | 2019 |
卷号 | 365页码:2019-02-09 |
关键词 | X-RAY-ABSORPTION ELECTRONIC-STRUCTURE SPECTROSCOPY OXIDE SCATTERING GA |
DOI | 10.1016/j.surfcoat.2018.04.013 |
英文摘要 | Local structural changes induced by ion bombardment in magnetron sputtered ZnO: Al films: Raman, XPS, and XAS study |
源URL | [http://ir.nimte.ac.cn/handle/174433/18303] ![]() |
专题 | 2019专题 |
作者单位 | Huang, F (reprint author), Chinese Acad Sci, Ningbo Inst Mat Technol & Engn, Ningbo 315201, Zhejiang, Peoples R China. |
推荐引用方式 GB/T 7714 | Meng, Fanping,Ge, Fangfang,Chen, Yuyun,et al. Local structural changes induced by ion bombardment in magnetron sputtered ZnO: Al films: Raman, XPS, and XAS study[J]. SURFACE & COATINGS TECHNOLOGY,2019,365:2019-02-09. |
APA | Meng, Fanping,Ge, Fangfang,Chen, Yuyun,Xu, Genbao,&Huang, Feng.(2019).Local structural changes induced by ion bombardment in magnetron sputtered ZnO: Al films: Raman, XPS, and XAS study.SURFACE & COATINGS TECHNOLOGY,365,2019-02-09. |
MLA | Meng, Fanping,et al."Local structural changes induced by ion bombardment in magnetron sputtered ZnO: Al films: Raman, XPS, and XAS study".SURFACE & COATINGS TECHNOLOGY 365(2019):2019-02-09. |
入库方式: OAI收割
来源:宁波材料技术与工程研究所
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