imagingofthealstructureofanultrathinaluminafilmgrownoncu9atal111bystm
文献类型:期刊论文
作者 | ZHANG Yun; YU YingHui; SHE LiMin; QIN ZhiHui; CAO GengYu |
刊名 | chinesephysicsletters
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出版日期 | 2011 |
卷号 | 28期号:6页码:066802 |
ISSN号 | 0256-307X |
英文摘要 | An ultrathin alumina film grown on a Cu-9 at.%Al(11)substrate is investigated using low-temperature scanning tunneling microscopy and spectroscopy.The topographic images show a zigzagged corrugation characterized by the heptagonal and pentagonal organization of interfacial aluminum atoms and by a dependence on the bias voltage.Furthermore,the dI/dV maps and the spectrum reveal an unoccupied state locating at about +0.26eV,which most likely originates from the aluminum-oxygen hybridization and is possibly responsible for the heptagonal and pentagonal arrangements of Al atoms. |
语种 | 英语 |
源URL | [http://ir.wipm.ac.cn/handle/112942/17853] ![]() |
专题 | 中国科学院武汉物理与数学研究所 |
作者单位 | 中国科学院武汉物理与数学研究所 |
推荐引用方式 GB/T 7714 | ZHANG Yun,YU YingHui,SHE LiMin,et al. imagingofthealstructureofanultrathinaluminafilmgrownoncu9atal111bystm[J]. chinesephysicsletters,2011,28(6):066802. |
APA | ZHANG Yun,YU YingHui,SHE LiMin,QIN ZhiHui,&CAO GengYu.(2011).imagingofthealstructureofanultrathinaluminafilmgrownoncu9atal111bystm.chinesephysicsletters,28(6),066802. |
MLA | ZHANG Yun,et al."imagingofthealstructureofanultrathinaluminafilmgrownoncu9atal111bystm".chinesephysicsletters 28.6(2011):066802. |
入库方式: OAI收割
来源:武汉物理与数学研究所
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