中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF

文献类型:期刊论文

作者Xue, CF; Meng, XY; Wu, YQ; Wang, Y; Wang, LS; Yang, SM; Zhao, J; Tai, RZ
刊名JOURNAL OF SYNCHROTRON RADIATION
出版日期2018
卷号25期号:-页码:1869-1876
关键词INTERFEROMETRIC LITHOGRAPHY FABRICATION PERFORMANCE BAND
ISSN号1600-5775
DOI10.1107/S1600577518012833
文献子类期刊论文
英文摘要A new spatially coherent beamline has been designed and constructed at the Shanghai Synchrotron Radiation Facility. Here, the design of the beamline is introduced and the spatial coherence is analyzed throughout the whole process by wave optics. The simulation results show good spatial coherence at the endstation and have been proven by experiment results.
语种英语
源URL[http://ir.sinap.ac.cn/handle/331007/31146]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
作者单位1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201800, Peoples R China
推荐引用方式
GB/T 7714
Xue, CF,Meng, XY,Wu, YQ,et al. The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF[J]. JOURNAL OF SYNCHROTRON RADIATION,2018,25(-):1869-1876.
APA Xue, CF.,Meng, XY.,Wu, YQ.,Wang, Y.,Wang, LS.,...&Tai, RZ.(2018).The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF.JOURNAL OF SYNCHROTRON RADIATION,25(-),1869-1876.
MLA Xue, CF,et al."The wave optical whole process design of the soft X-ray interference lithography beamline at SSRF".JOURNAL OF SYNCHROTRON RADIATION 25.-(2018):1869-1876.

入库方式: OAI收割

来源:上海应用物理研究所

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