Resolving 500 nm axial separation by multi-slice X-ray ptychography
文献类型：期刊论文
| 作者 | Huang, XJ; Yan, HF; He, Y; Ge, MY; Ozturk, H; Fang, YLL; Ha, S; Lin, MF; Lu, M; Nazaretski, E |
| 刊名 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
 |
| 出版日期 | 2019 |
| 卷号 | 75期号:-页码:336—341 |
| 关键词 | HIGH-RESOLUTION MICROSCOPY CRYSTALLOGRAPHY OPTIMIZATION FLUORESCENCE SCATTERING DEPTH |
| ISSN号 | 2053-2733 |
| DOI | 10.1107/S2053273318017229 |
| 文献子类 | 期刊论文 |
| 英文摘要 | Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution. |
| 语种 | 英语 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/31799]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA; 2.Brookhaven Natl Lab, Natl Synchrotron Light Source 2, Upton, NY 11973 USA; 3.Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China; 4.Ozyegin Univ, Dept Mech Engn, TR-34794 Istanbul, Turkey; 5.UCL, London Ctr Nanotechnol, London WC1H 0AH, England 6.Brookhaven Natl Lab, Computat Sci Initiat, Upton, NY 11973 USA; 7.Brookhaven Natl Lab, Condensed Matter Phys & Mat Dept, Upton, NY 11973 USA; |
| 推荐引用方式 GB/T 7714 | Huang, XJ,Yan, HF,He, Y,et al. Resolving 500 nm axial separation by multi-slice X-ray ptychography[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,2019,75(-):336—341. |
| APA | Huang, XJ.,Yan, HF.,He, Y.,Ge, MY.,Ozturk, H.,...&Chu, YS.(2019).Resolving 500 nm axial separation by multi-slice X-ray ptychography.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,75(-),336—341. |
| MLA | Huang, XJ,et al."Resolving 500 nm axial separation by multi-slice X-ray ptychography".ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 75.-(2019):336—341. |
入库方式： OAI收割
来源：上海应用物理研究所
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