Low-dose, high-resolution and high-efficiency ptychography at STXM beamline of SSRF
文献类型：会议论文
| 作者 | Xu, ZJ; Wang, CP; Liu, HG; Tao, XL; Tai, RZ |
| 出版日期 | 2017 |
| 会议日期 | AUG 15-19, 2016 |
| 会议地点 | Diamond Light Source, Oxford, ENGLAND |
| 关键词 | RAY MICROSCOPY |
| 期号 | — |
| DOI | 10.1088/1742-6596/849/1/012033 |
| 英文摘要 | Ptychography is a diffraction-based X-ray microscopy method that can image extended samples quantitatively while remove the resolution limit imposed by image-forming optical elements. As a natural extension of scanning transmission X-ray microscopy (STXM) imaging method, we developed soft X-ray ptychographic coherent diffraction imaging (PCDI) method at the STXM endstation of BL08U beamline of Shanghai Synchrotron Radiation Facility. Compared to the traditional STXM imaging, the new PCDI method has resulted in significantly lower dose, higher resolution and higher efficiency imaging in our platform. In the demonstration experiments shown here, a spatial resolution of sub-10 nm was obtained for a gold nanowires sample, which is much better than the limit resolution 30 nm of the STXM method, while the radiation dose is only 1/12 of STXM. |
| 会议录 | X-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016)
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| 文献子类 | 会议论文 |
| 语种 | 英语 |
| ISSN号 | 1742-6588 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/31915]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, 239 Zhangheng Rd, Shanghai 201204, Peoples R China |
| 推荐引用方式 GB/T 7714 | Xu, ZJ,Wang, CP,Liu, HG,et al. Low-dose, high-resolution and high-efficiency ptychography at STXM beamline of SSRF[C]. 见:. Diamond Light Source, Oxford, ENGLAND. AUG 15-19, 2016. |
入库方式： OAI收割
来源：上海应用物理研究所
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