中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Initial Test of Optoelectronic High Power Microwave Generation From 6H-SiC Photoconductive Switch

文献类型:期刊论文

作者Wu, Qilin; Zhao, Yuxin; Xun, Tao; Yang, Hanwu; Huang, Wei
刊名IEEE ELECTRON DEVICE LETTERS
出版日期2019-07-01
卷号40期号:7页码:1167
关键词6H silicon carbide (6H-SiC) class B microwave power amplifier (MPA) photoconductive semiconductor switches (PCSS) microwave photonics (MWP)
ISSN号0741-3106
DOI10.1109/LED.2019.2918954
文献子类Article
英文摘要High-power photoconductive semiconductor switch (PCSS) working in linear mode can be used for RF generation by modulating the illuminating light. This letter presents a design and initial test of an optoelectronic class B push-pullmicrowave power amplifier (MPA) using two 6H-SiC photoconductive switches. The initial tests have been conducted with bias voltage of +/- 2.4 kV, at 80 kW peak laser pulse power, demonstrating that the SiC PCSS working in linear mode can produce microwaves. Then, circuit simulation is conducted to study the factors affecting the electrical efficiency, such as the quantum efficiency, the peak laser pulse power, and the bias voltage. It is speculated that the MPA could output 1 mW microwave power and achieve electrical efficiency of more than 60% with a bias voltage of 15 kV, quantum efficiency of 0.2, and peak laser pulse power of 100 kW.
WOS研究方向Engineering
语种英语
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://ir.sic.ac.cn/handle/331005/27006]  
专题中国科学院上海硅酸盐研究所
推荐引用方式
GB/T 7714
Wu, Qilin,Zhao, Yuxin,Xun, Tao,et al. Initial Test of Optoelectronic High Power Microwave Generation From 6H-SiC Photoconductive Switch[J]. IEEE ELECTRON DEVICE LETTERS,2019,40(7):1167.
APA Wu, Qilin,Zhao, Yuxin,Xun, Tao,Yang, Hanwu,&Huang, Wei.(2019).Initial Test of Optoelectronic High Power Microwave Generation From 6H-SiC Photoconductive Switch.IEEE ELECTRON DEVICE LETTERS,40(7),1167.
MLA Wu, Qilin,et al."Initial Test of Optoelectronic High Power Microwave Generation From 6H-SiC Photoconductive Switch".IEEE ELECTRON DEVICE LETTERS 40.7(2019):1167.

入库方式: OAI收割

来源:上海硅酸盐研究所

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