An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures
文献类型：期刊论文
| 作者 | Ma, Jiayu; Zhang, Yuzhi; Wu, Lingnan; Li, Haogeng; Song, Lixin |
| 刊名 | MATERIALS
 |
| 出版日期 | 2019-04-10 |
| 卷号 | 12期号:7 |
| 关键词 | spectral emissivity radiation vacuum low temperature |
| ISSN号 | 1996-1944 |
| DOI | 10.3390/ma12071141 |
| 文献子类 | Article |
| 英文摘要 | Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 m at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K. |
| WOS研究方向 | Materials Science |
| 语种 | 英语 |
| 出版者 | MDPI |
| 源URL | [http://ir.sic.ac.cn/handle/331005/27195]  |
| 专题 | 中国科学院上海硅酸盐研究所 |
| 推荐引用方式 GB/T 7714 | Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,et al. An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures[J]. MATERIALS,2019,12(7). |
| APA | Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,Li, Haogeng,&Song, Lixin.(2019).An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures.MATERIALS,12(7). |
| MLA | Ma, Jiayu,et al."An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures".MATERIALS 12.7(2019). |
入库方式： OAI收割
来源：上海硅酸盐研究所
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