Systematic investigation of electrical contact barriers between different electrode metals and layered GeSe
文献类型：期刊论文
| 作者 | Li, Ranran; Xia, Wei; Guo, Yanfeng; Xue, Jiamin |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 2019-01-07 |
| 卷号 | 114期号:1 |
| ISSN号 | 0003-6951 |
| DOI | 10.1063/1.5042821 |
| 文献子类 | Article |
| 英文摘要 | For electronic and photoelectronic devices based on GeSe, an emergent two dimensional monochalcogenide with many exciting properties predicted, good electrical contacts are of great importance for achieving high device performances and exploring the intrinsic physics of GeSe. In this article, we use temperature-dependent transport measurements and thermionic emission theory for systematic investigation of the contact-barrier heights between GeSe and six common electrode metals, Al, Ag, Ti, Au, Pt, and Pd. These metals cover a wide range of work functions (from similar to 3.6 eV to similar to 5.7 eV). Our study indicates that Au forms the best contact with the valence band of GeSe even though Au does not possess the highest work function among the metals studied. This behavior clearly deviates from the expectation of Schottky-Mott theory and indicates the importance of the details at the interfaces between metals and GeSe. Published. under license by ALP Publishing. |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| 出版者 | AMER INST PHYSICS |
| 源URL | [http://ir.sic.ac.cn/handle/331005/27405]  |
| 专题 | 中国科学院上海硅酸盐研究所 |
| 推荐引用方式 GB/T 7714 | Li, Ranran,Xia, Wei,Guo, Yanfeng,et al. Systematic investigation of electrical contact barriers between different electrode metals and layered GeSe[J]. APPLIED PHYSICS LETTERS,2019,114(1). |
| APA | Li, Ranran,Xia, Wei,Guo, Yanfeng,&Xue, Jiamin.(2019).Systematic investigation of electrical contact barriers between different electrode metals and layered GeSe.APPLIED PHYSICS LETTERS,114(1). |
| MLA | Li, Ranran,et al."Systematic investigation of electrical contact barriers between different electrode metals and layered GeSe".APPLIED PHYSICS LETTERS 114.1(2019). |
入库方式： OAI收割
来源：上海硅酸盐研究所
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