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An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes

文献类型：期刊论文

作者Chen J5; Yang L4; Han Y5; Bao YH3; Zhang KL5; Li X2; Pang J2; Chen HS5; Song WL5; Wei YJ(魏宇杰)1
刊名JOURNAL OF POWER SOURCES
出版日期2019-12-31
卷号444页码:5
ISSN号0378-7753
关键词Lithium ion batteries Silicon film Multi-beam optical sensor (MOS) in situ stress measurement Colorimetric method
DOI10.1016/j.jpowsour.2019.227227
通讯作者Yang, Le(yangle@tsinghua.edu.cn) ; Chen, Hao-Sen(chenhs@bit.edu.cn)
英文摘要Here an in situ system is presented to simultaneously study the evolution of both morphology and stress in the silicon thin film electrode during lithiation and delithiation. Owing to the specific design with two observation windows in the in situ cell, both the curvature and color of the silicon thin-film electrodes upon lithiation and delithiation processes can be measured by multi-optical sensor and optical microscope. By such colorimetric method, the color evolution can be used to represent the thickness of silicon thin film electrode, and the quantitative relationship can be obtained by in situ atomic force microscope and optical microscopy experiments. Combining the real thickness with Stoney equation, the accurate stress of the LixSi film can be obtained during the electrochemical cycles.
分类号一类
WOS关键词LITHIUM-ION BATTERIES ; ELECTROCHEMICAL LITHIATION ; FRACTURE ENERGY ; EVOLUTION ; LI ; INTERPHASE
资助项目National Natural Science Foundation of China[11672341] ; National Natural Science Foundation of China[11572002] ; National Key Research and Development Program of China[2018YFB0104400] ; Innovative Research Groups of the National Natural Science Foundation of China[11521202] ; National Materials Genome Project[2016YFB0700600] ; State Key Laboratory of Explosion Science and Technology[ZDKT18-03] ; Beijing Natural Science Foundation[16L00001] ; Beijing Natural Science Foundation[2182065]
WOS研究方向Chemistry ; Electrochemistry ; Energy & Fuels ; Materials Science
语种英语
WOS记录号WOS:000501401900007
资助机构National Natural Science Foundation of China ; National Key Research and Development Program of China ; Innovative Research Groups of the National Natural Science Foundation of China ; National Materials Genome Project ; State Key Laboratory of Explosion Science and Technology ; Beijing Natural Science Foundation
其他责任者Yang, Le ; Chen, Hao-Sen
源URL[http://dspace.imech.ac.cn/handle/311007/81214]  
专题力学研究所_非线性力学国家重点实验室
作者单位1.Chinese Acad Sci, Inst Mech, LNM, Beijing 100190, Peoples R China
2.China Automot Battery Res Inst Co Ltd, Beijing 100088, Peoples R China;
3.Peking Univ, Coll Engn, State Key Lab Turbulence & Complex Syst, Beijing 100871, Peoples R China;
4.Tsinghua Univ, AML, CNMM, Dept Engn Mech, Beijing 100084, Peoples R China;
5.Beijing Inst Technol, Inst Adv Struct Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China;
推荐引用方式
GB/T 7714		 Chen J,Yang L,Han Y,et al. An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes[J]. JOURNAL OF POWER SOURCES,2019,444:5.
APA Chen J.,Yang L.,Han Y.,Bao YH.,Zhang KL.,...&Fang DN.(2019).An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes.JOURNAL OF POWER SOURCES,444,5.
MLA Chen J,et al."An in situ system for simultaneous stress measurement and optical observation of silicon thin film electrodes".JOURNAL OF POWER SOURCES 444(2019):5.

入库方式： OAI收割

来源：力学研究所

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