A fault injection system for space imaging application
文献类型：会议论文
| 作者 | Wang, Jinqiao1,2; Duan, Yongqiang1 ; Ma, Tengfei1
|
| 出版日期 | 2019 |
| 会议日期 | 2019-07-07 |
| 会议地点 | Beijing, China |
| 关键词 | space imaging fault injection scrubbing SRAM-based FPGA |
| 卷号 | 11335 |
| DOI | 10.1117/12.2544241 |
| 英文摘要 | The SRAM-based FPGAs are widely used in space imaging system because of their reprogramming advantages. However, designers must be concerned with the effect of single event upset(SEU) on FPGA configuration memory in the space application. To evaluate the performance of SRAM-based FPGA against SEU, simulating SEU fault injection test is a common method. This paper mainly studies the method of fault injection test and the structure of test platform. The data of CCD driving timing is flipped bit by bit on the test platform. And finally count the fault rate is 1.25%, then taking about 240ms to repair the fault. © 2019 SPIE. |
| 产权排序 | 1 |
| 会议录 | AOPC 2019: Display Technology and Optical Storage
 |
| 会议录出版者 | SPIE |
| 语种 | 英语 |
| ISSN号 | 0277786X;1996756X |
| ISBN号 | 9781510634428 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/93192]  |
| 专题 | 西安光学精密机械研究所_空间光学应用研究室 |
| 作者单位 | 1.Xi'an Institute of Optics and Precision Mechanics, CAS, Xi'an; 710119, China; 2.University of Chinese Academy of Science, Beijing; 100049, China |
| 推荐引用方式 GB/T 7714 | Wang, Jinqiao,Duan, Yongqiang,Ma, Tengfei. A fault injection system for space imaging application[C]. 见:. Beijing, China. 2019-07-07. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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