System, method and fixture for performing both optical power and wavelength measurements of light emitted from a laser diode
文献类型：专利
| 作者 | LUO, GUIPENG; ANSELM, KLAUS ALEXANDER; CHANG, HUNG-LUN |
| 发表日期 | 2016-07-07 |
| 专利号 | US20160197453A1 |
| 著作权人 | APPLIED OPTOELECTRONICS, INC. |
| 国家 | 美国 |
| 文献子类 | 发明申请 |
| 其他题名 | System, method and fixture for performing both optical power and wavelength measurements of light emitted from a laser diode |
| 英文摘要 | A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously detecting the light for performing a first test including the optical power measurement(s) and reflecting the light for performing a second test including the wavelength measurement(s). The testing fixture may include an angled photodetector and an optical coupling system such as a collimating lens, a focal lens and an optical waveguide. The testing fixture may be electrically connected to an optical power testing module, such as a light-current-voltage (LIV) testing module, for performing the optical power measurement(s) and may be optically coupled to a wavelength measurement module, such as an optical spectrum analyzer (OSA) for performing the wavelength measurement(s). |
| 公开日期 | 2016-07-07 |
| 申请日期 | 2015-01-02 |
| 状态 | 授权 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/87012]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | APPLIED OPTOELECTRONICS, INC. |
| 推荐引用方式 GB/T 7714 | LUO, GUIPENG,ANSELM, KLAUS ALEXANDER,CHANG, HUNG-LUN. System, method and fixture for performing both optical power and wavelength measurements of light emitted from a laser diode. US20160197453A1. 2016-07-07. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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