Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact
文献类型：期刊论文
| 作者 | Xiao KL(肖凯璐)3,4 ; Wu XQ(吴先前)1,4; Wu CW(吴臣武)4; Yin QY(尹秋运)2; Huang CG(黄晨光)3,4; Huang CG(黄晨光); Huang CG(黄晨光); Wu CW(吴臣武); Wu XQ(吴先前); Wu XQ(吴先前)
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| 刊名 | RSC ADVANCES
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| 出版日期 | 2020-04-03 |
| 卷号 | 10期号:23页码:13470-13479 |
| ISSN号 | 2046-2069 |
| DOI | 10.1039/c9ra10082b |
| 通讯作者 | Wu, Xianqian(wuxianqian@imech.ac.cn) |
| 英文摘要 | Residual stresses play a crucial role in both light-electricity conversion performances and the lifespan of photovoltaic (PV) cells. In this paper, the residual stress of triple junction cells (i.e. GaInP/GaInAs/Ge) induced by laser-driven massive micro-particle impact is analyzed with a novel method based on backscattering Raman spectroscopy. The impact process, which induces damage to the PV cells and brings the residual stress, is also investigated by optical microscopy (OM) and Scanning Electron Microscopy (SEM). The results show that the PV cells would exhibit various damage patterns. At the same time, strong residual stresses up to hundreds of MPa introduced in the damaged PV cells after impact have been analysis, providing an effective perspective to better understand the damage behavior and residual stress features of PV cells during their service life. |
| 分类号 | 二类 |
| WOS关键词 | RAY MICRO-DIFFRACTION ; SILICON SOLAR-CELLS ; RAMAN-SCATTERING ; MODULES ; EVOLUTION ; SIMULATION ; DISORDER ; LAMINATE ; BEHAVIOR ; DIAMOND |
| 资助项目 | National Natural Science Foundation of China[11572327] ; National Natural Science Foundation of China[11672315] ; National Natural Science Foundation of China[11772347] ; Science Challenge Project[TZ2018001] ; Strategic Priority Research Program of Chinese Academy of Sciences[XDA17030100] ; Strategic Priority Research Program of Chinese Academy of Sciences[XDA17030200] ; Strategic Priority Research Program of Chinese Academy of Sciences[XDB22040302] ; Strategic Priority Research Program of Chinese Academy of Sciences[XDB22040303] |
| WOS研究方向 | Chemistry |
| 语种 | 英语 |
| WOS记录号 | WOS:000530352000015 |
| 资助机构 | National Natural Science Foundation of China ; Science Challenge Project ; Strategic Priority Research Program of Chinese Academy of Sciences |
| 其他责任者 | Wu, Xianqian |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/82039]  |
| 专题 | 力学研究所_流固耦合系统力学重点实验室(2012-) |
| 作者单位 | 1.CALTECH, Mat & Proc Simulat Ctr, Pasadena, CA 91125 USA 2.Sun Yat Sen Univ, Sch Engn, Dept Appl Mech & Engn, Guangzhou 510275, PR, Peoples R China; 3.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China; 4.Chinese Acad Sci, Inst Mech, 15 Beisihuanxi Rd, Beijing 100190, Peoples R China; |
| 推荐引用方式 GB/T 7714 | Xiao KL,Wu XQ,Wu CW,et al. Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact[J]. RSC ADVANCES,2020,10(23):13470-13479. |
| APA | 肖凯璐.,吴先前.,吴臣武.,尹秋运.,黄晨光.,...&Xiao KL.(2020).Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact.RSC ADVANCES,10(23),13470-13479. |
| MLA | 肖凯璐,et al."Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact".RSC ADVANCES 10.23(2020):13470-13479. |
入库方式： OAI收割
来源：力学研究所
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