Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices
文献类型：期刊论文
| 作者 | Yuan Li; Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen |
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 2019 |
| 卷号 | 126期号:6页码:065704 |
| 语种 | 英语 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/29556]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen. Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices[J]. Journal of Applied Physics,2019,126(6):065704. |
| APA | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen.(2019).Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices.Journal of Applied Physics,126(6),065704. |
| MLA | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen."Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices".Journal of Applied Physics 126.6(2019):065704. |
入库方式： OAI收割
来源：半导体研究所
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