One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs
文献类型:期刊论文
作者 | Gao, Guilong1; He, Kai1; Yi, Tao2; Lv, Meng3; Yuan, Yun4; Yan, Xin1; Yin, Fei1; Li, Shaohui1; Hu, Ronghao3; Wang, Tao1 |
刊名 | AIP Advances |
出版日期 | 2020-04-01 |
卷号 | 10期号:4 |
ISSN号 | 21583226 |
DOI | 10.1063/5.0005771 |
产权排序 | 1 |
英文摘要 | An interferometric semiconductor x-ray detection system is proposed in this paper. The system is based on the RadOptic effect, and it utilizes Fabry-Perot interferometry to measure radiation-induced changes in the optical refractive index of a semiconductor (GaAs). In this work, the intrinsic time resolution and the sensitivity of a Fabry-Perot interferometric sensor were systemically studied. Based on the transient free carrier absorption model, the prototype system was established to quantitatively measure the time-dependent x-ray flux with the deconvolution algorithm for the first time. The time resolution of the detection system was approximately 21 ps, and the output signal induced by an x-ray pulse showed a high signal-to-noise ratio and immunity to electromagnetic interference. This interferometer will enable x-ray bang-time and fusion burn-history measurements in inertial confinement fusion with higher time resolution. © 2020 Author(s). |
语种 | 英语 |
出版者 | American Institute of Physics Inc. |
WOS记录号 | WOS:000527707900003 |
源URL | [http://ir.opt.ac.cn/handle/181661/93405] |
专题 | 条纹相机工程中心 |
作者单位 | 1.Key Laboratory of Ultra-Fast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics (XIOPM, Chinese Academy of Sciences (CAS), Xi'an, Shaanxi; 710119, China; 2.Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan; 621900, China; 3.College of Physics, Sichuan University, Chendu, Sichuan; 610064, China; 4.Rocket Force Academy, Beijing; 100101, China |
推荐引用方式 GB/T 7714 | Gao, Guilong,He, Kai,Yi, Tao,et al. One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs[J]. AIP Advances,2020,10(4). |
APA | Gao, Guilong.,He, Kai.,Yi, Tao.,Lv, Meng.,Yuan, Yun.,...&Tian, Jinshou.(2020).One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs.AIP Advances,10(4). |
MLA | Gao, Guilong,et al."One-shot x-ray detection based on the instantaneous change in the refractive index of GaAs".AIP Advances 10.4(2020). |
入库方式: OAI收割
来源:西安光学精密机械研究所
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