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NanoSIMS measurements of sub-micrometer particles using the local thresholding technique

文献类型：期刊论文

作者Hao, Jialong1,2; Yang, Wei1,2; Huang, Wenjuan3; Xu, Yuchen1,2; Lin, Yangting1,2; Changela, Hitesh1,2
刊名SURFACE AND INTERFACE ANALYSIS
出版日期2019-12-12
页码6
关键词local thresholding segmentation NanoSIMS particles analysis
ISSN号0142-2421
DOI10.1002/sia.6711
英文摘要NanoSIMS has been the most widely used analytical technique for measuring the elemental and isotopic ratios of micrometer to sub-micrometer particles, e.g., pre-solar grains, soil particles, and fog-helium aerosol particles. Automated sample stage movement combined with particle recognition algorithm is commonly used to improve analytical efficiency. However, due to the effect of sample topography or variation in ion yield rates, the global thresholding method used in previous studies has a low recognition rate. In order to improve the recognition rate, here we have developed a high-efficiency sub-micron particle recognition method. This method searches for the threshold that minimizes the intra-class variance of the local domain (the radius of the local is set to 10 pixels). The central pixel of this circular ROI is then tested against the threshold found for this region. Presolar grains from the Qingzhen (EH3) meteorite and soil organic particles from Oxisol were analyzed. The analytical efficiency was improved by 120-200% compared with the global thresholding algorithms. This method can be widely applied in automated studies of large numbers of micrometer to sub-micrometer particles.
WOS关键词MATTER ; DUST
资助项目National Natural Science Foundation of China[41503013] ; National Natural Science Foundation of China[41890843] ; National Key Research and Development Program of China[2018YFA 0702601]
WOS研究方向Chemistry
语种英语
WOS记录号WOS:000502268800001
出版者WILEY
资助机构National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China
源URL[http://ir.iggcas.ac.cn/handle/132A11/95783]  
专题地质与地球物理研究所_中国科学院地球与行星物理重点实验室
通讯作者Yang, Wei
作者单位1.Chinese Acad Sci, Innovat Acad Earth Sci, Beijing, Peoples R China
2.Chinese Acad Sci, Inst Geol & Geophys, Key Lab Earth & Planetary Phys, Beijing 100029, Peoples R China
3.Iowa State Univ, Dept Ecol Evolut & Organismal Biol, Ames, IA USA
推荐引用方式
GB/T 7714		 Hao, Jialong,Yang, Wei,Huang, Wenjuan,et al. NanoSIMS measurements of sub-micrometer particles using the local thresholding technique[J]. SURFACE AND INTERFACE ANALYSIS,2019:6.
APA Hao, Jialong,Yang, Wei,Huang, Wenjuan,Xu, Yuchen,Lin, Yangting,&Changela, Hitesh.(2019).NanoSIMS measurements of sub-micrometer particles using the local thresholding technique.SURFACE AND INTERFACE ANALYSIS,6.
MLA Hao, Jialong,et al."NanoSIMS measurements of sub-micrometer particles using the local thresholding technique".SURFACE AND INTERFACE ANALYSIS (2019):6.

入库方式： OAI收割

来源：地质与地球物理研究所

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