中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
DetNAS: Backbone Search for Object Detection

文献类型:会议论文

作者Chen, Yukang2; Yang, Tong1; Zhang, Xiangyu1; Meng, Gaofeng2; Xiao, Xinyu2; Sun, Jian1
出版日期2019-12
会议日期2019-12-8
会议地点加拿大温哥华
英文摘要

Object detectors are usually equipped with backbone networks designed for image classification. It might be sub-optimal because of the gap between the tasks of image classification and object detection. In this work, we present DetNAS to use Neural Architecture Search (NAS) for the design of better backbones for object detection. It is non-trivial because detection training typically needs ImageNet pre-training while NAS systems require accuracies on the target detection task as supervisory signals. Based on the technique of one-shot supernet, which contains all possible networks in the search space, we propose a framework for backbone search on object detection. We train the supernet under the typical detector training schedule: ImageNet pre-training and detection fine-tuning. Then, the architecture search is performed on the trained supernet, using the detection task as the guidance. This framework makes NAS on backbones very efficient. In experiments, we show the effectiveness of DetNAS on various detectors, for instance, one-stage RetinaNet and the two-stage FPN. We empirically find that networks searched on object detec- tion shows consistent superiority compared to those searched on ImageNet classifi- cation. The resulting architecture achieves superior performance than hand-crafted networks on COCO with much less FLOPs complexity.

语种英语
资助项目National Natural Science Foundation of China[61773377] ; National Natural Science Foundation of China[61573352] ; National Natural Science Foundation of China[91646207]
源URL[http://ir.ia.ac.cn/handle/173211/39089]  
专题自动化研究所_模式识别国家重点实验室_遥感图像处理团队
作者单位1.旷视科技
2.中科院自动化所
推荐引用方式
GB/T 7714
Chen, Yukang,Yang, Tong,Zhang, Xiangyu,et al. DetNAS: Backbone Search for Object Detection[C]. 见:. 加拿大温哥华. 2019-12-8.

入库方式: OAI收割

来源:自动化研究所

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