中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Anti-Makeup: Learning A Bi-Level Adversarial Network for Makeup-Invariant Face Verification

文献类型:会议论文

作者Li, Yi1,2,3,4; Song, Lingxiao2,3,4; Wu, Xiang2,3,4; He, Ran1,2,3,4; Tan, Tieniu1,2,3,4
出版日期2018-02
会议日期February 2–7, 2018
会议地点New Orleans, Louisiana, USA
英文摘要

Makeup is widely used to improve facial attractiveness and is well accepted by the public. However, different makeup styles will result in significant facial appearance changes. It remains a challenging problem to match makeup and non-makeup face images. This paper proposes a learning from generation approach for makeup-invariant face verification by introducing a bi-level adversarial network (BLAN). To alleviate the negative effects from makeup, we first generate non-makeup images from makeup ones, and then use the synthesized nonmakeup images for further verification. Two adversarial networks in BLAN are integrated in an end-to-end deep network, with the one on pixel level for reconstructing appealing facial images and the other on feature level for preserving identity information. These two networks jointly reduce the sensing gap between makeup and non-makeup images. Moreover, we make the generator well constrained by incorporating multiple perceptual losses. Experimental results on three benchmark makeup face datasets demonstrate that our method achieves state-of-the-art verification accuracy across makeup status and can produce photo-realistic non-makeup face images.

源URL[http://ir.ia.ac.cn/handle/173211/39175]  
专题自动化研究所_智能感知与计算研究中心
作者单位1.University of Chinese Academy of Sciences
2.National Laboratory of Pattern Recognition, CASIA
3.Center for Research on Intelligent Perception and Computing, CASIA
4.Center for Excellence in Brain Science and Intelligence Technology, CAS
推荐引用方式
GB/T 7714
Li, Yi,Song, Lingxiao,Wu, Xiang,et al. Anti-Makeup: Learning A Bi-Level Adversarial Network for Makeup-Invariant Face Verification[C]. 见:. New Orleans, Louisiana, USA. February 2–7, 2018.

入库方式: OAI收割

来源:自动化研究所

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