Test-retest Reliability of Functional Connectivity and Graph Metrics in the Resting Brain Network
文献类型:会议论文
作者 | Jin, Dan2,3![]() ![]() ![]() ![]() ![]() |
出版日期 | 2018-07 |
会议日期 | July 18-21 |
会议地点 | Honolulu, HI, USA |
英文摘要 | The combination of graph theoretical approaches and neuroimaging data provides a powerful way to explore the characteristics of brain network. Recently, the temporal variability of spontaneous brain activity and functional connectivity has attracted wide attention. Thus, it is essential to evaluate the reliability of functional network connectivity and properties from the dynamic perspective. However, previous test-retest (TRT) studies have explored this reliability with a static point of view. In this study, using a large rs-fMRI dataset from Human Connectome Project (HCP), we investigated TRT reliability of functional connectivity and graph metrics derived from the most commonly used method – sliding window at three time intervals (short: 72 seconds, middle: 15 minutes and long: >24 hours). The results revealed that reliable connectivities and related brain regions are mainly distributed in primary cortex, such as visual area and sensorimotor area and default mode network. Notably, connectivity strength and global efficiency have better reliability than other metrics. Finally, short scan time interval and long scan duration can increase the TRT reliability of metrics. Findings of present study provide important guidance for searching reliable network markers in future research. |
会议录出版者 | IEEE |
源URL | [http://ir.ia.ac.cn/handle/173211/39157] ![]() |
专题 | 自动化研究所_脑网络组研究中心 |
通讯作者 | Liu, Yong |
作者单位 | 1.CAS Center for Excellence in Brain Science and Intelligence Technology, Institute of Automation, Chinese Academy of Sciences, Beijing, China 2.Brainnetome Center & National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China 3.University of Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Jin, Dan,Xu, Kaibin,Liu, Bing,et al. Test-retest Reliability of Functional Connectivity and Graph Metrics in the Resting Brain Network[C]. 见:. Honolulu, HI, USA. July 18-21. |
入库方式: OAI收割
来源:自动化研究所
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