Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere
文献类型：期刊论文
| 作者 | Jin, Linghua1; Liu, Miao2,3; Li, Chenhui2,3; Song, Dongpo4; Yang, Bingbing2; Zhu, Xuebin2
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| 刊名 | JOURNAL OF ALLOYS AND COMPOUNDS
 |
| 出版日期 | 2020-11-30 |
| 卷号 | 843 |
| 关键词 | Epitaxial BFO thin films Ferroelectric Precursor Annealing atmosphere |
| ISSN号 | 0925-8388 |
| DOI | 10.1016/j.jallcom.2020.155910 |
| 通讯作者 | Jin, Linghua(jinlh@mail.ustc.edu.cn) ; Yang, Bingbing(yang00@mail.ustc.edu.cn) |
| 英文摘要 | Solution derived high-quality epitaxial BiFeO3 (BFO) thin films, with robust spontaneous polarization, are still desired because of their advantages. Herein, epitaxial BFO thin films and SrRuO3 bottom electrodes are prepared on LaAlO3 substrates via chemical solution deposition (CSD) technique. The influences of precursor solution on the microstructure and electrical properties are investigated by using nitrate salt and acetate salt system. The XRD and P-E hysteresis loops results demonstrate that the BFO thin film prepared by acetate salt system as a relatively green CSD route shows good epitaxial characteristic and ferroelectric performances. In addition, the effect of the annealing atmosphere on the microstructure and electrical properties are studied for the acetate salt derived BFO thin films. The microstructure and defects chemistry are analyzed by SEM and XPS, the BFO thin film annealed in air shows better comprehensive ferroelectric performances with the lowest leakage current and enhanced ferroelectric polarization due to the improved microstructure and decreased defect concentrations. The results here thus provide an instructive approach to optimize the growth of solution-derived epitaxial BFO-based thin films. (C) 2020 Elsevier B.V. All rights reserved. |
| WOS关键词 | FERROELECTRIC PROPERTIES ; DEPOSITION |
| 资助项目 | Scientific Research Foundation of Hunan Provincial Education Department, China[18C0440] |
| WOS研究方向 | Chemistry ; Materials Science ; Metallurgy & Metallurgical Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000556137400010 |
| 出版者 | ELSEVIER SCIENCE SA |
| 资助机构 | Scientific Research Foundation of Hunan Provincial Education Department, China |
| 源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/44953]  |
| 专题 | 中国科学院合肥物质科学研究院 |
| 通讯作者 | Jin, Linghua; Yang, Bingbing |
| 作者单位 | 1.Univ South China, Sch Chem & Chem Engn, Hengyang 421001, Peoples R China 2.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China 3.Univ Sci & Technol China, Hefei 230026, Peoples R China 4.Jiangsu Univ Sci & Technol, Dept Phys, Zhenjiang 212003, Jiangsu, Peoples R China |
| 推荐引用方式 GB/T 7714 | Jin, Linghua,Liu, Miao,Li, Chenhui,et al. Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2020,843. |
| APA | Jin, Linghua,Liu, Miao,Li, Chenhui,Song, Dongpo,Yang, Bingbing,&Zhu, Xuebin.(2020).Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere.JOURNAL OF ALLOYS AND COMPOUNDS,843. |
| MLA | Jin, Linghua,et al."Evolution of structure and electrical properties of epitaxial BiFeO3 thin films through solution and annealing atmosphere".JOURNAL OF ALLOYS AND COMPOUNDS 843(2020). |
入库方式： OAI收割
来源：合肥物质科学研究院
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