Characterizing Hydrogen Microbubble Stiffness Properties Using Atomic Force Microscopy
文献类型:期刊论文
作者 | Yu, Huiyang2; Xue, Yuxuan2; Sun, Zhiyong1,2; Xi, Ning2 |
刊名 | IEEE TRANSACTIONS ON NANOTECHNOLOGY
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出版日期 | 2020 |
卷号 | 19 |
关键词 | Temperature measurement Force Hydrogen Probes Temperature Force measurement AFM microbubble stiffness anisotropic property temperature-dependent |
ISSN号 | 1536-125X |
DOI | 10.1109/TNANO.2020.2975060 |
通讯作者 | Sun, Zhiyong(sunzy@iim.ac.cn) ; Xi, Ning(xining@hku.hk) |
英文摘要 | In the past decades, bubbles have been gaining extensive attentions for their wide range of applications, especially those at the micro-scale. Research on the bubbles' mechanical properties is necessary for better implementations. Precise measurement of the microbubbles' mechanical properties (e.g. stiffness and adhesion) relies largely on delicate manipulation technologies in aqueous environment. As a consequence, atomic force microscopy (AFM) has been widely adopted in this field. Bubble stiffness is an important indicator to reflect the stability. Existing studies mainly focused on statistic property of the microbubbles' stiffness, which may omit delicate specific characteristics of a single microbubble. In this letter, as an instance, AFM-based stiffness measurement of a single hydrogen microbubble has been carried out. The electrochemistry method was adopted to generate stable hydrogen microbubbles. By using force volume mode of a commercial AFM, the temperature-dependent stiffness property of the microbubble was studied. Furthermore, stiffness map of a single microbubble was captured, which shows location-dependent anisotropic characteristic, contradicting the preassumption that stiffness of bubbles should be isotropic. To explain this phenomenon, the contact condition between the AFM tip and the bubble surface is considered as the key reason that induces the anisotropic observation, and a corresponding model is established to verify this hypothesis. |
WOS关键词 | BUBBLE ; NANOBUBBLES ; ULTRASOUND ; DELIVERY ; SURFACE ; DRUG |
资助项目 | ITF[GHP/040/17GD] ; ABB[200008545] |
WOS研究方向 | Engineering ; Science & Technology - Other Topics ; Materials Science ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000522425300002 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
资助机构 | ITF ; ABB |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/103479] ![]() |
专题 | 中国科学院合肥物质科学研究院 |
通讯作者 | Sun, Zhiyong; Xi, Ning |
作者单位 | 1.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Intelligent Machines, Hefei 230031, Peoples R China 2.Univ Hong Kong, Dept Ind & Mfg Syst Engn, Pokfulam, Hong Kong, Peoples R China |
推荐引用方式 GB/T 7714 | Yu, Huiyang,Xue, Yuxuan,Sun, Zhiyong,et al. Characterizing Hydrogen Microbubble Stiffness Properties Using Atomic Force Microscopy[J]. IEEE TRANSACTIONS ON NANOTECHNOLOGY,2020,19. |
APA | Yu, Huiyang,Xue, Yuxuan,Sun, Zhiyong,&Xi, Ning.(2020).Characterizing Hydrogen Microbubble Stiffness Properties Using Atomic Force Microscopy.IEEE TRANSACTIONS ON NANOTECHNOLOGY,19. |
MLA | Yu, Huiyang,et al."Characterizing Hydrogen Microbubble Stiffness Properties Using Atomic Force Microscopy".IEEE TRANSACTIONS ON NANOTECHNOLOGY 19(2020). |
入库方式: OAI收割
来源:合肥物质科学研究院
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