Backward Diode Rectifying Behavior in AgCrO2/In2O3
文献类型:期刊论文
作者 | Li, Chenhui1,4; Yang, Bingbing4,5; Wei, Renhuai4![]() ![]() ![]() ![]() ![]() ![]() |
刊名 | IEEE ELECTRON DEVICE LETTERS
![]() |
出版日期 | 2020-04-01 |
卷号 | 41 |
关键词 | Backward diode delafossite In2O3 transparent |
ISSN号 | 0741-3106 |
DOI | 10.1109/LED.2020.2975005 |
通讯作者 | Wei, Renhuai(rhwei@issp.ac.cn) ; Zhu, Xuebin(xbzhu@issp.ac.cn) |
英文摘要 | A backward diode consisting of all nondegenerate and transparent semiconducting oxides (TSOs) offers promising opportunities for designing multifunctional electronic devices. In this letter, we report the backward diode rectifying behavior in the nondegenerate AgCrO2/In2O3 p-n heterojunction. Both AgCrO2 and In2O3 films are transparent. The decrease of grain boundary in the In2O3 film can improve the backward diode rectifying performance. The optimized AgCrO2/In2O3 heterojunction exhibits a very high reverse rectification ratio that exceeds 10(3) along with a small tunneling current onset voltage. The backward diode rectifying behavior originates from the electron band-to-band tunneling (BTBT) current in the reverse voltage region, which is induced by type-III band alignment. This study will pave the way for achieving transparent backward diodes by using all nondegenerate TSOs p-n heterojunctions. |
WOS关键词 | FILMS |
资助项目 | National Natural Science Foundation of China[11604337] ; Key Laboratory of Photovoltaic and Energy Conservation Materials |
WOS研究方向 | Engineering |
语种 | 英语 |
WOS记录号 | WOS:000522206300004 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
资助机构 | National Natural Science Foundation of China ; Key Laboratory of Photovoltaic and Energy Conservation Materials |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/103633] ![]() |
专题 | 中国科学院合肥物质科学研究院 |
通讯作者 | Wei, Renhuai; Zhu, Xuebin |
作者单位 | 1.Univ Sci & Technol China, Sci Isl Branch, Grad Sch, Hefei 230026, Peoples R China 2.Chinese Acad Sci, High Magnet Field Lab, Hefei 230031, Peoples R China 3.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Jiangsu, Peoples R China 4.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China 5.Auhui Univ, Inst Phys Sci & Informat Technol, Hefei 230601, Peoples R China |
推荐引用方式 GB/T 7714 | Li, Chenhui,Yang, Bingbing,Wei, Renhuai,et al. Backward Diode Rectifying Behavior in AgCrO2/In2O3[J]. IEEE ELECTRON DEVICE LETTERS,2020,41. |
APA | Li, Chenhui.,Yang, Bingbing.,Wei, Renhuai.,Hu, Ling.,Tang, Xianwu.,...&Sun, Yuping.(2020).Backward Diode Rectifying Behavior in AgCrO2/In2O3.IEEE ELECTRON DEVICE LETTERS,41. |
MLA | Li, Chenhui,et al."Backward Diode Rectifying Behavior in AgCrO2/In2O3".IEEE ELECTRON DEVICE LETTERS 41(2020). |
入库方式: OAI收割
来源:合肥物质科学研究院
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。