Effect of gamma irradiation on (K,Na,Li)(Ta,Nb)O-3-CaZrO3 lead-free ferroelectric film grown on La0.67Ba0.33MnO3 and La0.67Ca0.33MnO3 conductive oxide electrode
文献类型:期刊论文
作者 | Qin, Feng1; Sun, Xiangyu4,5; Gong, Dongdong4,5; Wang, Yicheng4,5; Chen, Yu4,5![]() ![]() |
刊名 | JOURNAL OF ALLOYS AND COMPOUNDS
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出版日期 | 2020-06-15 |
卷号 | 826 |
关键词 | KNN-LT-CZ Lead-free ferroelectric film Oxide electrodes Gamma irradiation |
ISSN号 | 0925-8388 |
DOI | 10.1016/j.jallcom.2019.152148 |
通讯作者 | Du, Yijia(duyijia@mtrc.ac.cn) |
英文摘要 | (K1-xNax)NbO3 (KNN)-based lead-free ferroelectric materials featured with the large piezoelectric coefficient, has long been considered as a very promising candidate to replace traditional lead-based ferroelectric materials. Irradiation resistance of materials is important for the application in strong irradiation environments, especially possible application in irradiation resistance devices. In this paper, 0.95(K0.49Na0.49Li0.02)(Ta0.2Nb0.8)O-3-0.05CaZrO(3) (KNN-LT-CZ) lead-free thin films have been grown on SrTiO3(001) substrates with La0.67Ca0.33MnO3 (LCMO) and La0.67Ba0.33MnO3 (LBMO) conductive oxide as bottom electrodes and metallic Pt as top ones. As large as 21% and 26% remnant polarization decay are distinguished in Pt/KNN-LT-CZ/LCMO and Pt/KNN-LT-CZ/LBMO films respectively, before and after gamma ray irradiation of 50 Mrad(Si). The irradiation even induced exotic current behavior in the latter ones, while the former ones exhibit only 10% decrease of the dielectric constant. The KNN-LT-CZ film grown on conductive metal oxides is associated with favorable irradiation resistance which would eventually benefit future design optimization in devices applied in more tough environments. (C) 2019 Published by Elsevier B.V. |
WOS关键词 | THIN-FILMS ; IONIZING-RADIATION ; DEGRADATION ; CAPACITORS ; RETENTION ; MODEL |
资助项目 | National Key Research and Development Program of China[2017YFA0403502] ; NSF of China[11574324] |
WOS研究方向 | Chemistry ; Materials Science ; Metallurgy & Metallurgical Engineering |
语种 | 英语 |
WOS记录号 | WOS:000519269300006 |
出版者 | ELSEVIER SCIENCE SA |
资助机构 | National Key Research and Development Program of China ; NSF of China |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/103815] ![]() |
专题 | 中国科学院合肥物质科学研究院 |
通讯作者 | Du, Yijia |
作者单位 | 1.Univ Elect Sci & Technol China, Sch Elect Sci & Engn, Chengdu 611731, Peoples R China 2.Chinese Acad Sci, High Magnet Field Lab, Hefei 230026, Peoples R China 3.Univ Sci & Technol China, Dept Phys, Hefei 230026, Peoples R China 4.China Acad Engn Phys, Inst Elect Engn, Mianyang 621900, Sichuan, Peoples R China 5.China Acad Engn Phys, Microsyst & Terahertz Res Ctr, Chengdu 610299, Peoples R China |
推荐引用方式 GB/T 7714 | Qin, Feng,Sun, Xiangyu,Gong, Dongdong,et al. Effect of gamma irradiation on (K,Na,Li)(Ta,Nb)O-3-CaZrO3 lead-free ferroelectric film grown on La0.67Ba0.33MnO3 and La0.67Ca0.33MnO3 conductive oxide electrode[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2020,826. |
APA | Qin, Feng.,Sun, Xiangyu.,Gong, Dongdong.,Wang, Yicheng.,Chen, Yu.,...&Bao, Jingfu.(2020).Effect of gamma irradiation on (K,Na,Li)(Ta,Nb)O-3-CaZrO3 lead-free ferroelectric film grown on La0.67Ba0.33MnO3 and La0.67Ca0.33MnO3 conductive oxide electrode.JOURNAL OF ALLOYS AND COMPOUNDS,826. |
MLA | Qin, Feng,et al."Effect of gamma irradiation on (K,Na,Li)(Ta,Nb)O-3-CaZrO3 lead-free ferroelectric film grown on La0.67Ba0.33MnO3 and La0.67Ca0.33MnO3 conductive oxide electrode".JOURNAL OF ALLOYS AND COMPOUNDS 826(2020). |
入库方式: OAI收割
来源:合肥物质科学研究院
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