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Complete Strain Mapping of Nanosheets of Tantalum Disulfide

文献类型：期刊论文

作者Cao, Yue1; Assefa, Tadesse1; Banerjee, Soham1,2; Wieteska, Andrew3; Wang, Dennis Zi-Ren2; Pasupathy, Abhay1,3; Tong, Xiao4; Liu, Yu5; Lu, Wenjian5; Sun, Yu-Ping5,6,7
刊名ACS APPLIED MATERIALS & INTERFACES
出版日期2020-09-23
卷号12
ISSN号1944-8244
关键词quasi-2D materials nano X-ray diffraction strain tensor strain mapping Young's modulus
DOI10.1021/acsami.0c06517
通讯作者Cao, Yue(yue.cao@anl.gov) ; Robinson, Ian K.(irobinson@bnl.gov)
英文摘要Quasi-two-dimensional (quasi-2D) materials hold promise for future electronics because of their unique band structures that result in electronic and mechanical properties sensitive to crystal strains in all three dimensions. Quantifying crystal strain is a prerequisite to correlating it with the performance of the device and calls for high resolution but spatially resolved rapid characterization methods. Here, we show that using fly-scan nano X-ray diffraction, we can accomplish a tensile strain sensitivity below 0.001% with a spatial resolution of better than 80 nm over a spatial extent of 100 mu m on quasi-2D flakes of 1T-TaS2. Coherent diffraction patterns were collected from a similar to 100 nm thick sheet of 1T-TaS2 by scanning a 12 keV focused X-ray beam across and rotating the sample. We demonstrate that the strain distribution around micron- and submicron-sized "bubbles" that are present in the sample may be reconstructed from these images. The experiments use state-of-the-art synchrotron instrumentation and will allow rapid and nonintrusive strain mapping of thin-film samples and electronic devices based on quasi-2D materials.
WOS关键词MONOLAYER ; MICROSCOPY
资助项目U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering[DE-SC0012704] ; U.S. Department of Energy, Office of Basic Energy Sciences[DE-AC0206CH11357] ; DOE Office of Science[DE-SC0012704] ; U.S. DOE Office of Science Facility, at Brookhaven National Laboratory[DE-SC0012704] ; National Defense Science and Engineering Graduate Fellowship (DOD-NDSEG) program ; National Key Research and Development Program[2016YFA0300404] ; National Nature Science Foundation of China[11674326] ; National Nature Science Foundation of China[11774352] ; National Nature Science Foundation of China[11874357] ; National Natural Science Foundation of China[U1832141] ; Chinese Academy of Sciences' Large-scale Scientific Facility[U1832141] ; Natural Science Foundation of Shanghai[17ZR1436800] ; Department of Energy[DE-SC0016703]
WOS研究方向Science & Technology - Other Topics ; Materials Science
语种英语
出版者AMER CHEMICAL SOC
WOS记录号WOS:000575557800078
资助机构U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering ; U.S. Department of Energy, Office of Basic Energy Sciences ; DOE Office of Science ; U.S. DOE Office of Science Facility, at Brookhaven National Laboratory ; National Defense Science and Engineering Graduate Fellowship (DOD-NDSEG) program ; National Key Research and Development Program ; National Nature Science Foundation of China ; National Natural Science Foundation of China ; Chinese Academy of Sciences' Large-scale Scientific Facility ; Natural Science Foundation of Shanghai ; Department of Energy
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/104464]  
专题中国科学院合肥物质科学研究院
通讯作者Cao, Yue; Robinson, Ian K.
作者单位1.Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY 11973 USA
2.Columbia Univ, Dept Appl Phys & Appl Math, New York, NY 10027 USA
3.Columbia Univ, Dept Phys, 538 W 120th St, New York, NY 10027 USA
4.Brookhaven Natl Lab, Ctr Funct Nanomat CFN, Upton, NY 11973 USA
5.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China
6.Chinese Acad Sci, High Magnet Lab, Hefei 230031, Peoples R China
7.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Peoples R China
8.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil SSRF, Shanghai 201800, Peoples R China
9.Brookhaven Natl Lab, Natl Synchrotron Light Source 2, Upton, NY 11973 USA
推荐引用方式
GB/T 7714		 Cao, Yue,Assefa, Tadesse,Banerjee, Soham,et al. Complete Strain Mapping of Nanosheets of Tantalum Disulfide[J]. ACS APPLIED MATERIALS & INTERFACES,2020,12.
APA Cao, Yue.,Assefa, Tadesse.,Banerjee, Soham.,Wieteska, Andrew.,Wang, Dennis Zi-Ren.,...&Robinson, Ian K..(2020).Complete Strain Mapping of Nanosheets of Tantalum Disulfide.ACS APPLIED MATERIALS & INTERFACES,12.
MLA Cao, Yue,et al."Complete Strain Mapping of Nanosheets of Tantalum Disulfide".ACS APPLIED MATERIALS & INTERFACES 12(2020).

入库方式： OAI收割

来源：合肥物质科学研究院

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