中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Design a Suitable Test Scheme for Triggering Bypass Protection Test of ITER PF Converter Unit

文献类型:期刊论文

作者Zhang, Xiuqing2; Gao, Ge2; Fu, Peng2; Song, Zhiquan2; Wang, Bo1
刊名IEEE TRANSACTIONS ON PLASMA SCIENCE
出版日期2018-05-01
卷号46期号:5页码:1318-1322
关键词Bypass international thermonuclear experimental reactor (ITER) poloidal field (PF) converter unit test scheme
ISSN号0093-3813
DOI10.1109/TPS.2018.2821183
英文摘要

The external bypass, as an important component of the international thermonuclear experimental reactor (ITER) poloidal field converter unit (PFCU), will provide a freewheeling loop for the load current to protect the magnets and PF converter modules from being damaged by overcurrent and overvoltage under fault conditions. The triggering bypass protection test is used to verify that the designed bypass is triggered normally and endure the rated load current. In this paper, a suitable test scheme is designed for triggering bypass protection test of ITER PFCU based on the PF converter integrated test platform at the Institute of Plasma Physics, Chinese Academy of Sciences. This test scheme includes the triggering bypass method, calculating the trigger angle of the converter in inverter and a method of reducing the bypass current to zero in the absence of ITER mechanical switch. The feasibility of the test scheme is successfully verified by the simulation results and test results, both of which prove that the external bypass of ITER PFCU is triggered normally and withstands the load current for 100 ms. Due to the integrated inductance of the actual dc output circuit, the actual transfer time of bypass current in the test is more than the simulation results.

WOS关键词DC TEST PLATFORM ; EXTERNAL BYPASS ; AC/DC CONVERTER ; ASIPP
资助项目ITER International Fusion Energy Organization through the International Thermonuclear Experimental Reactor Project[4.1.P2.CN.01] ; China International Nuclear Fusion Energy Program Execution Centre
WOS研究方向Physics
语种英语
WOS记录号WOS:000431521700038
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/35564]  
专题合肥物质科学研究院_中科院等离子体物理研究所
通讯作者Zhang, Xiuqing
作者单位1.Anhui Huadian Engn Consultating & Design Co Ltd, Hefei 230022, Anhui, Peoples R China
2.Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Anhui, Peoples R China
推荐引用方式
GB/T 7714
Zhang, Xiuqing,Gao, Ge,Fu, Peng,et al. Design a Suitable Test Scheme for Triggering Bypass Protection Test of ITER PF Converter Unit[J]. IEEE TRANSACTIONS ON PLASMA SCIENCE,2018,46(5):1318-1322.
APA Zhang, Xiuqing,Gao, Ge,Fu, Peng,Song, Zhiquan,&Wang, Bo.(2018).Design a Suitable Test Scheme for Triggering Bypass Protection Test of ITER PF Converter Unit.IEEE TRANSACTIONS ON PLASMA SCIENCE,46(5),1318-1322.
MLA Zhang, Xiuqing,et al."Design a Suitable Test Scheme for Triggering Bypass Protection Test of ITER PF Converter Unit".IEEE TRANSACTIONS ON PLASMA SCIENCE 46.5(2018):1318-1322.

入库方式: OAI收割

来源:合肥物质科学研究院

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