中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model

文献类型:期刊论文

作者Liu, Tongshun1; Zhu, Kunpeng2; Zeng, Liangcai3
刊名IEEE-ASME TRANSACTIONS ON MECHATRONICS
出版日期2018-06-01
卷号23期号:3页码:1456-1466
关键词Degradation process forward-backward algorithm health monitoring Hidden semi-Markov remaining useful life (RUL)
ISSN号1083-4435
DOI10.1109/TMECH.2018.2823320
英文摘要

The intelligent estimation of degradation state and the prediction of remaining useful life (RUL) are important for the maintenance of industrial equipment. In this study, the degradation process of equipment is modeled as an improved hidden semi-Markov model (HSMM), in which the dependence of durations of adjacent degradation states is described and modeled in the HSMM. To avoid underflow problem in computing the forward and backward variables, a modified forward-backward algorithm is proposed in the HSMM. Based on the improved algorithm, online estimation of degradation state and the distribution of RUL can be obtained. Case studies on tool wearing diagnosis and prognosis have verified the effectiveness of this model.

WOS关键词MILLING TOOL WEAR ; MACHINING PROCESSES ; FAULT-DIAGNOSIS ; PREDICTION ; ALGORITHM
资助项目National Natural Science Foundation of China[51475443] ; CAS 100 Talents Program, Chinese Academy of Sciences
WOS研究方向Automation & Control Systems ; Engineering
语种英语
WOS记录号WOS:000435338300045
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/38240]  
专题合肥物质科学研究院_中科院合肥物质科学研究院先进制造技术研究所
通讯作者Zhu, Kunpeng
作者单位1.Univ Sci & Technol China, Dept Automat, Hefei 230026, Anhui, Peoples R China
2.Chinese Acad Sci, Hefei Inst Phys Sci, Inst Adv Mfg Technol, Changzhou 213164, Peoples R China
3.Wuhan Univ Sci & Technol, Sch Machinery & Automat, Wuhan 430081, Hubei, Peoples R China
推荐引用方式
GB/T 7714
Liu, Tongshun,Zhu, Kunpeng,Zeng, Liangcai. Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model[J]. IEEE-ASME TRANSACTIONS ON MECHATRONICS,2018,23(3):1456-1466.
APA Liu, Tongshun,Zhu, Kunpeng,&Zeng, Liangcai.(2018).Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model.IEEE-ASME TRANSACTIONS ON MECHATRONICS,23(3),1456-1466.
MLA Liu, Tongshun,et al."Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model".IEEE-ASME TRANSACTIONS ON MECHATRONICS 23.3(2018):1456-1466.

入库方式: OAI收割

来源:合肥物质科学研究院

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